Terahertz bench for comprehensive characterization and non-destructive testing of laminated materials

Y. Abautret; C. Amra; M. Zerrad

doi:10.1117/12.3017397

18 June 2024 Terahertz bench for comprehensive characterization and non-destructive testing of laminated materials

Y. Abautret, C. Amra, M. Zerrad

Proceedings Volume PC12994, Terahertz Photonics III; PC129940F (2024) https://doi.org/10.1117/12.3017397
Event: SPIE Photonics Europe, 2024, Strasbourg, France

Abstract

Over the past three decades, science community has seen development and emergence of terahertz technologies. This frequency range which is halfway between optical and radio wavelength is very interesting since most of materials show transparency in this band. Furthermore, emission et detection techniques of such rays allow to get amplitude and phase of the signal. In this paper we propose to exploit these properties with a terahertz bench that can acquire signals reflected and transmitted from a laminated sample with different incident angles.

Conference Presentation

Citation Download Citation

Y. Abautret, C. Amra, and M. Zerrad "Terahertz bench for comprehensive characterization and non-destructive testing of laminated materials", Proc. SPIE PC12994, Terahertz Photonics III, PC129940F (18 June 2024); https://doi.org/10.1117/12.3017397

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available