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1 October 2024 The role of native defects in the residual absorption in CdSiP2
Timothy D. Gustafson, Nancy C. Giles, Kevin T. Zawilski, Peter G. Schunemann, Kent L. Averett, Jonathan E. Slagle, Larry E. Halliburton
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Proceedings Volume PC13140, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XVIII; PC1314004 (2024) https://doi.org/10.1117/12.3029472
Event: Optical Engineering + Applications, 2024, San Diego, California, United States
Abstract
Cadmium silicon phosphide, CdSiP2 (CSP), crystals have good nonlinear optical properties resulting in their use in optical parametric generation (OPO and OPA) of mid-infrared light. One common limitation on the performance of OPO materials is residual optical absorption which often results from point defects formed during crystal growth. Electron paramagnetic resonance (EPR) is a powerful technique for identifying and tracking point defects in materials. By correlating behaviors of native point defects exposed to 1064 nm light using EPR with changes in optical absorption bands, models are proposed for three of the observed broad optical absorption bands.
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Timothy D. Gustafson, Nancy C. Giles, Kevin T. Zawilski, Peter G. Schunemann, Kent L. Averett, Jonathan E. Slagle, and Larry E. Halliburton "The role of native defects in the residual absorption in CdSiP2", Proc. SPIE PC13140, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XVIII, PC1314004 (1 October 2024); https://doi.org/10.1117/12.3029472
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KEYWORDS
Absorption
Silicon
Cadmium
Crystals
Data modeling
Optical parametric oscillators
Defect detection
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