Curvature And Strain Variations By Rasterography

Jacob Politch; S. Gryc; U. Etrog

doi:10.1117/12.7976801

1 November 1988 Curvature And Strain Variations By Rasterography

Jacob Politch, S. Gryc, U. Etrog

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Optical Engineering, Vol. 27, Issue 11, 271113 (November 1988). https://doi.org/10.1117/12.7976801

Abstract

Rasterography was developed for measurements of three-dimensional surface height distribution. It is extended here to the measurement of strains due to changes in curvature under an object's deformation. The method is demonstrated for a cylindrical shell segment under static loading. However, the method is general in that it can be applied for any curved surface loaded statically.

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Jacob Politch, S. Gryc, and U. Etrog "Curvature And Strain Variations By Rasterography," Optical Engineering 27(11), 271113 (1 November 1988). https://doi.org/10.1117/12.7976801

Published: 1 November 1988

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