1 March 1988 Moire Strain Gauge With High Sensitivity
F. P. Chiang, C. L. Yuan, R. Krishnamurth
Author Affiliations +
Abstract
A microcomputer-based moire strain gauge with high sensitivity is developed that is capable of measuring strain automatically.
F. P. Chiang, C. L. Yuan, and R. Krishnamurth "Moire Strain Gauge With High Sensitivity," Optical Engineering 27(3), 273231 (1 March 1988). https://doi.org/10.1117/12.7977918
Published: 1 March 1988
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CITATIONS
Cited by 1 scholarly publication.
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KEYWORDS
Moire patterns

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