Optical Engineering
VOL. 29 · NO. 12 | December 1990
CONTENTS
IN THIS ISSUE

Articles (15)
Articles
Jack Gaskill
Optical Engineering, Vol. 29, Issue 12, (December 1990) https://doi.org/10.1117/1.OE.29.12.223
Open Access
Optical Engineering, Vol. 29, Issue 12, (December 1990) https://doi.org/10.1117/1.OE.29.12.225
Open Access
Norman Kopeika, I. Kogan, R. Israeli, Its'hak Dinstein
Optical Engineering, Vol. 29, Issue 12, (December 1990) https://doi.org/10.1117/12.55757
TOPICS: Spatial frequencies, Image quality, Atmospheric modeling, Atmospheric particles, Meteorology, Atmospheric propagation, Humidity, Aerosols, Atmospheric propagation engineering, Modulation transfer functions
Jian Li, Xianyu Su, Lurong Guo
Optical Engineering, Vol. 29, Issue 12, (December 1990) https://doi.org/10.1117/12.55746
TOPICS: Fourier transforms, Modulation, 3D metrology, Phase shifting, Spatial frequencies, Ronchi rulings, Projection systems, Phase shifts, 3D modeling, Optical filters
Lixin Chen, Bing Yang, Xierong Hu
Optical Engineering, Vol. 29, Issue 12, (December 1990) https://doi.org/10.1117/12.55745
TOPICS: Temperature metrology, Radiation effects, Tellurium, Opacity, Infrared sensors, Infrared radiation, Remote sensing, Analytical research, Reflection, Atmospheric optics
Stefan Karbacher
Optical Engineering, Vol. 29, Issue 12, (December 1990) https://doi.org/10.1117/12.55747
TOPICS: Distance measurement, Object recognition, Binary data, Cameras, Linear filtering, Library classification systems, Superposition, Classification systems, Image processing, Calibration
Serafim Efstratiadis, Aggelos Katsaggelos
Optical Engineering, Vol. 29, Issue 12, (December 1990) https://doi.org/10.1117/12.55748
TOPICS: Image restoration, Matrices, Image quality, Visualization, Calcium, Image processing, Algorithms, Silicon, Visibility, Radon
Edmond Jonckheere, Yik Kwoh, Woei-Chyn Chu, Behnam Bavarian
Optical Engineering, Vol. 29, Issue 12, (December 1990) https://doi.org/10.1117/12.55749
TOPICS: Distortion, Magnetism, Image processing, Magnetic resonance imaging, Robotics, Scanners, Computed tomography, Head, Calibration, Ferromagnetics
James McGuire Jr., Russell Chipman
Optical Engineering, Vol. 29, Issue 12, (December 1990) https://doi.org/10.1117/12.55756
TOPICS: Polarization, Modulation transfer functions, Imaging systems, Optical components, Optical transfer functions, Radiometry, Wave plates, Wavefronts, Fourier transforms, Modulation
James Sirkis
Optical Engineering, Vol. 29, Issue 12, (December 1990) https://doi.org/10.1117/12.55751
TOPICS: Cameras, Signal to noise ratio, Motion models, Charge-coupled devices, Image processing, Mathematical modeling, Detection and tracking algorithms, Interference (communication), Digital image processing, Pattern recognition
David Hsu
Optical Engineering, Vol. 29, Issue 12, (December 1990) https://doi.org/10.1117/12.55750
TOPICS: Silicon, Etching, Laser induced fluorescence, Chemical reactions, Ionization, Chemical species, Photolysis, Spectroscopy, NOx, Molecules
Paul Barham, Louis Harrison, David McAllister
Optical Engineering, Vol. 29, Issue 12, (December 1990) https://doi.org/10.1117/12.55752
TOPICS: Cameras, Computer graphics, Video, 3D image processing, Visual system, Device simulation, Eye, 3D modeling, Visualization, Imaging systems
Ting-Chung Poon, Jinwoo Park, Guy Indebetouw
Optical Engineering, Vol. 29, Issue 12, (December 1990) https://doi.org/10.1117/12.55753
TOPICS: Spatial filters, Optical transfer functions, Modulation transfer functions, Heterodyning, Spatial frequencies, Bandpass filters, Tunable filters, Optical filters, Acousto-optics, Gaussian beams
Osami Sasaki, Kazuhide Takahashi, Takamasa Suzuki
Optical Engineering, Vol. 29, Issue 12, (December 1990) https://doi.org/10.1117/12.55754
TOPICS: Interferometers, Feedback control, Semiconductor lasers, Modulation, Phase shift keying, Phase measurement, Control systems, Signal detection, Interferometry, Feedback signals
Ajay Saxena, L. Yeswanth
Optical Engineering, Vol. 29, Issue 12, (December 1990) https://doi.org/10.1117/12.55755
TOPICS: Prisms, Fizeau interferometers, Reflection, Optical components, Autocollimation, Interferometers, Glasses, Fringe analysis, Error analysis, Wavefronts
Back to Top