1 December 1993 Interplanetary He II extreme-ultraviolet observation on PLANET-B
Masato Nakamura, Tatsundo Yamamoto, Koichiro Tsuruda, Yoshifumi Saito, Koujun Yamashita, Akihiro Furuzawa, Toshihiro Ogawa, Supriya Chakrabarti
Author Affiliations +
Abstract
Japan's spacecraft PLANET-B will be launched to Mars in 1998. An extreme-ultraviolet (EUV) measurement of 30.4-nm wavelength is proposed for an interplanetary He+ observation during the cruising phase from Earth to Mars. This measurement will help our understanding of the creation and loss of interplanetary He+. Another objective is to image the plasmasphere and magnetotail of the Earth. The EUV scanner we have designed for the PLANET-B mission will provide the opportunity to observe both interplanetary and magnetospheric He+. In addition, we describe another improved design of this EUV scanner, which covers wavelengths from 30 to 90 nm. This improved scanner will measure scattered light from helium (58.4 nm) and oxygen ions (83.4 nm) in addition to He II.
Masato Nakamura, Tatsundo Yamamoto, Koichiro Tsuruda, Yoshifumi Saito, Koujun Yamashita, Akihiro Furuzawa, Toshihiro Ogawa, and Supriya Chakrabarti "Interplanetary He II extreme-ultraviolet observation on PLANET-B," Optical Engineering 32(12), (1 December 1993). https://doi.org/10.1117/12.155625
Published: 1 December 1993
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Cited by 4 scholarly publications.
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KEYWORDS
Extreme ultraviolet

Scanners

Helium

Ions

Extreme ultraviolet lithography

Mars

Microchannel plates

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