1 May 1995 Neural network step-frequency fault locator
Satoshi Fujii, Keigo Iizuka
Author Affiliations +
Abstract
A step-frequency fault locator was constructed as a new diagnostic tool for integrated optics devices. The wavelength of the light was swept stepwise from 1.5 to 1.6 μm in steps less than 1 nm. The image of the target was processed using a neural network algorithm. Detailed comparisons between the results using the neural network algorithm and FFT algorithm have been presented. Obtained resolution was of the order of microns. The overall dimensions were reduced to 7 x l0 x 2 in. by replacing bulk optic elements with fiber-optic elements.
Satoshi Fujii and Keigo Iizuka "Neural network step-frequency fault locator," Optical Engineering 34(5), (1 May 1995). https://doi.org/10.1117/12.199888
Published: 1 May 1995
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CITATIONS
Cited by 1 scholarly publication and 2 patents.
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KEYWORDS
Neural networks

Signal detection

Glasses

Avalanche photodetectors

Terahertz radiation

Bragg cells

Optical fibers

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