General model for moiré contouring, part 2: applications

Cesar A. Sciammarella; Luciano Lamberti; Antonio Boccaccio; Eustachio Cosola; Domenico Posa

doi:10.1117/1.2899040

1 March 2008 General model for moiré contouring, part 2: applications

Cesar A. Sciammarella, Luciano Lamberti, Antonio Boccaccio, Eustachio Cosola, Domenico Posa

Author Affiliations +

Optical Engineering, Vol. 47, Issue 3, 033606 (March 2008). https://doi.org/10.1117/1.2899040

Abstract

Applications are presented of the general shadow-projection moiré model described in the companion paper, "A general model for moiré contouring, part 1: theory." Two examples are discussed in detail. One example deals with the deflection of a large-size thin panel subjected to bending. The other example analyzes the accuracy that can be achieved in laser lithography rapid prototyping. The first example illustrates some theoretical aspects of the general contouring model proposed in this research and explains the reasons for differences between theoretical predictions and experimental results. In the second example, the whole process of data gathering and merging using geometric primitives and optimization techniques is demonstrated practically. Finally, a clear relationship between the measured standard deviations and moiré sensitivity values is obtained. The results show that the proposed methodologies lead to a quasi-quadratic correlation.

©(2008) Society of Photo-Optical Instrumentation Engineers (SPIE)

Citation Download Citation

Cesar A. Sciammarella, Luciano Lamberti, Antonio Boccaccio, Eustachio Cosola, and Domenico Posa "General model for moiré contouring, part 2: applications," Optical Engineering 47(3), 033606 (1 March 2008). https://doi.org/10.1117/1.2899040

Published: 1 March 2008

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