High-density three-dimensional measurements through multilayer perceptron calibration and statistical band-limited patterns

Eugene Wong; Andreas Walter Stark; Holger Babovsky; Richard Kowarschik

doi:10.1117/1.OE.57.7.070501

5 July 2018 High-density three-dimensional measurements through multilayer perceptron calibration and statistical band-limited patterns

Eugene Wong, Andreas Walter Stark, Holger Babovsky, Richard Kowarschik

Author Affiliations +

Optical Engineering, Vol. 57, Issue 7, 070501 (July 2018). https://doi.org/10.1117/1.OE.57.7.070501

Abstract

Calibration of optical metrology stereophotogrammetric systems is vital to obtain accurate and precise three-dimensional (3-D) measurements. Despite its importance, the work pipeline of intrinsic and extrinsic camera calibration still remains manually laborious with high technical complexity. The use of a multilayer perceptron neural network to calibrate an optical metrology stereophotogrammetric system utilizing a statistical band-limited pattern projection system is demonstrated. Highly accurate, highly precise, and highly dense 3-D surface reconstructions are obtained solely from homologous corresponding pairs without the need for intrinsic and extrinsic camera calibration. Measurement performance in the typical optical metrology sense, where 3-D measurements were evaluated with respect to length and surface gauges, is shown.

Citation Download Citation

Eugene Wong, Andreas Walter Stark, Holger Babovsky, and Richard Kowarschik "High-density three-dimensional measurements through multilayer perceptron calibration and statistical band-limited patterns," Optical Engineering 57(7), 070501 (5 July 2018). https://doi.org/10.1117/1.OE.57.7.070501

Received: 7 March 2018; Accepted: 12 June 2018; Published: 5 July 2018

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