13 February 2020 High-speed three-dimensional absolute shape measurement with three projected binary patterns
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Abstract

Reducing the number of structured patterns for three-dimensional (3-D) reconstruction is of great importance for high-speed 3-D shape measurement. We present a method that reconstructs absolute 3-D shape using three projected binary patterns: one direct current (DC), one low-frequency, and one high-frequency fringe pattern. The procedures are (1) take the difference between the sinusoidal fringe patterns and the DC pattern; (2) apply Hilbert transform to the difference images to generate two phase maps; (3) employ the geometric-constraint-based phase unwrapping method to unwrap the low-frequency phase map; (4) unwrap the high-frequency phase map using the unwrapped low-frequency phase map; and (5) reconstruct 3-D shape. We developed a prototype system that can capture two-dimensional images at 6000 Hz, achieving 2000 Hz 3-D shape measurement speed.

© 2020 Society of Photo-Optical Instrumentation Engineers (SPIE) 0091-3286/2020/$28.00 © 2020 SPIE
Jae-Sang Hyun and Song Zhang "High-speed three-dimensional absolute shape measurement with three projected binary patterns," Optical Engineering 59(2), 024104 (13 February 2020). https://doi.org/10.1117/1.OE.59.2.024104
Received: 18 November 2019; Accepted: 27 January 2020; Published: 13 February 2020
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CITATIONS
Cited by 10 scholarly publications.
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KEYWORDS
3D metrology

Fringe analysis

3D image processing

Cameras

Optical spheres

Binary data

Projection systems

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