Adam M. Kennedy
Sr Principal Engineer at RTX Corp
SPIE Involvement:
Author
Publications (21)

Proceedings Article | 8 June 2015 Paper
A. Kennedy, P. Masini, M. Lamb, J. Hamers, T. Kocian, E. Gordon, W. Parrish, R. Williams, T. LeBeau
Proceedings Volume 9451, 94511C (2015) https://doi.org/10.1117/12.2177462
KEYWORDS: Semiconducting wafers, Sensors, Cameras, Thermal weapon sites, Microbolometers, Manufacturing, Semiconductors, Electronics, Packaging, Accelerated life testing

Proceedings Article | 17 September 2011 Paper
Neil Malone, Adam Kennedy, Roger Graham, Yen Thai, Justin Stark, Joe Sienicki, Eric Fest
Proceedings Volume 8154, 81540T (2011) https://doi.org/10.1117/12.897345
KEYWORDS: Polarimetry, Long wavelength infrared, Sensors, Mid-IR, Polarization, Staring arrays, Polarizers, Optical filters, Reflectivity, Image fusion

Proceedings Article | 22 April 2008 Paper
Donald King, Jason Graham, Adam Kennedy, Richard Mullins, Jeffrey McQuitty, William Radford, Thomas Kostrzewa, Elizabeth Patten, Thomas McEwan, James Vodicka, John Wootan
Proceedings Volume 6940, 69402R (2008) https://doi.org/10.1117/12.786620
KEYWORDS: Sensors, Video, Staring arrays, Video processing, Electronics, Nonuniformity corrections, Readout integrated circuits, Forward looking infrared, Long wavelength infrared, Mid-IR

Proceedings Article | 17 May 2006 Paper
D. Murphy, M. Ray, A. Kennedy, J. Wyles, C. Hewitt, R. Wyles, E. Gordon, T. Sessler, S. Baur, D. Van Lue, S. Anderson, R. Chin, H. Gonzalez, C. Le Pere, S. Ton
Proceedings Volume 6206, 62061A (2006) https://doi.org/10.1117/12.674018
KEYWORDS: Staring arrays, Sensors, Microbolometers, Electronics, Readout integrated circuits, Cameras, Nonuniformity corrections, Thermography, Resistance, Infrared imaging

Proceedings Article | 31 May 2005 Paper
D. Murphy, M. Ray, A. Kennedy, J. Wyles, C. Hewitt, R. Wyles, E. Gordon, T. Sessler, S. Baur, D. Van Lue, S. Anderson, R. Chin, H. Gonzalez, C. Le Pere, S. Ton, T. Kostrzewa
Proceedings Volume 5783, (2005) https://doi.org/10.1117/12.609462
KEYWORDS: Microbolometers, Staring arrays, Sensors, Readout integrated circuits, Thermography, Infrared imaging, Bolometers, Mid-IR, Resistance, Electronics

Showing 5 of 21 publications
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