Ahmet Koray Erdamar
Phd Researcher at Technische Univ Delft
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Publications (1)

Proceedings Article | 12 September 2011 Paper
Proceedings Volume 8095, 80951J (2011) https://doi.org/10.1117/12.893940
KEYWORDS: Photonic crystals, Silicon, Crystals, Temperature metrology, Absorption, Refractive index, Silicon photonics, Thermal optics, Absorbance, Optical testing

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