Akihiro Yoshida
at Kwansei Gakuin Univ.
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 30 December 2020 Poster + Paper
Proceedings Volume 11454, 1145438 (2020) https://doi.org/10.1117/12.2562976
KEYWORDS: X-rays, X-ray imaging, CMOS sensors, Photon counting, Image resolution, Spectroscopy, Optical imaging, Charge-coupled devices, Imaging spectroscopy, Manufacturing

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