Laser irradiation has been recognized as a promising tool across a number of biomedical applications. However, understanding the molecular mechanisms and cellular responses remains incomplete. Here, we investigated the mechanism involved in the apoptotic process in human hepatic cells under laser irradiation. Our data show that the laser-mediated alternation of mitochondrial membrane potential leads apoptosis in Huh7 and Alexander cells. Contrary, HepG2 cells are resistant to laser induced cell death. The observed link between mitochondrial membrane potential and cytotoxicity could be a fundamental phenomenon in laser-induced cell apoptosis.
Authors introduce several results of high quality mirror segments testing. The segments were designed for the large-area
light-weight mirror systems for UV detectors of weak optical signals. For this category of the optical components, an increasing of demands on technology production is typical. This is caused by various reasons: 1) Thickness to diameter ratio is 1:100 for this type of segments. For astronomical mirrors, this ratio is about 1:10. This is the reason why the manufacturing technology of the light-weight segment surfaces was changed. Similarly, usually used testing methods of the shape of the optical surfaces are changed. The shapes of the
surfaces are evaluated by the minimal spot diameter of the reflected beam, which contains 95% of the incident light; 2) Processing technology of working surfaces was enhanced because of the UV light wavelength. The technology must respect the fact that the amount of diffused light in the short UV wavelength region is increasing in the
dependence on the surface roughness of the mirror; 3) Surface reflectivity is not the only important parameter of the optical reflecting thin film systems in this kind of applications. Surface roughness and homogeneity of thin films are taken into account of testing methods too.
This investigation deals with determination of optical parameters of thin PLZT films prepared by pulsed laser deposition on fused silica substrates at different oxygen pressure. Film composition and structure are investigated by WDX and XRD. Defects concentration in the films is studied using triboluminescence. Changes of film refractive index n((lambda) ), extinction k((lambda) ) with wavelength in the spectral region 0.3 - 1.1 micrometers and film thickness d are determined as a result of transmittance spectra processing. Waveguiding properties of the films are investigated.
In this work, determination of the refractive index profile and the optical gap E02 of PbZr1-XTiO3 thin films is described. Measurements were performed with the J. A Woollam spectral ellipsometer working on rotate analyzer mode. The temperature dependence of optical constants was obtained with a specially designed heating device.
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