Dr. Antonello De Martino Profile

Dr. Antonello De Martino

Researcher at Ecole Polytechnique

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Author

Publications (26)

SPIE Journal Paper | 5 February 2016 Open Access

Optical fiber-based full Mueller polarimeter for endoscopic imaging using a two-wavelength simultaneous measurement method

Jérémy Vizet, Sandeep Manhas, Jacqueline Tran, Pierre Validire, Abdelali Benali, Enric Garcia-Caurel, Angelo Pierangelo, Antonello De Martino, Dominique Pagnoux

JBO, Vol. 21, Issue 07, 071106, (February 2016) https://doi.org/10.1117/12.10.1117/1.JBO.21.7.071106

KEYWORDS: Polarimetry, Endoscopy, Optical fibers, Tissues, Microscopes, Calibration, Polysomnography, Colon, Polarization, Fiber characterization

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Proceedings Article | 21 May 2014 Paper

An overview of polarimetric sensing techniques and technology with applications to different research fields

Frans Snik, Julia Craven-Jones, Michael Escuti, Silvano Fineschi, David Harrington, Antonello De Martino, Dimitri Mawet, Jérôme Riedi, J. Scott Tyo

Proceedings Volume 9099, 90990B (2014) https://doi.org/10.1117/12.2053245

KEYWORDS: Polarimetry, Polarization, Modulation, Calibration, Astronomy, Wave plates, Signal detection, Polarizers, Sensors, Remote sensing

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SPIE Journal Paper | 23 April 2013 Open Access

Multispectral Mueller polarimetric imaging detecting residual cancer and cancer regression after neoadjuvant treatment for colorectal carcinomas

Angelo Pierangelo, Sandeep Manhas, Abdelali Benali, Clément Fallet, Jean-Laurent Totobenazara, Maria Rosaria Antonelli, Tatiana Novikova, Brice Gayet, Antonello De Martino, Pierre Validire

JBO, Vol. 18, Issue 04, 046014, (April 2013) https://doi.org/10.1117/12.10.1117/1.JBO.18.4.046014

KEYWORDS: Cancer, Polarimetry, Oncology, Multispectral imaging, Colorectal cancer, Tumors, Statistical analysis, Tissues, Colon, Rectum

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SPIE Journal Paper | 4 June 2012 Open Access

Ex vivo photometric and polarimetric multilayer characterization of human healthy colon by multispectral Mueller imaging

Angelo Pierangelo, Sandeep Manhas, Abdelali Benali, Clément Fallet, Maria-Rosaria Antonelli, Tatiana Novikova, Brice Gayet, Pierre Validire, Antonello De Martino

JBO, Vol. 17, Issue 06, 066009, (June 2012) https://doi.org/10.1117/12.10.1117/1.JBO.17.6.066009

KEYWORDS: Colon, Polarimetry, Tissues, Multispectral imaging, Reflectivity, Backscatter, Polarization, Cancer, Statistical analysis, Colorectal cancer

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Proceedings Article | 10 September 2011 Paper

Overlay measurement by angle resolved Mueller polarimetry

Clément Fallet, Tatiana Novikova, Aline Jolibois, Bicher Haj Ibrahim, Antonello De Martino, Cyril Vannuffel

Proceedings Volume 8160, 81600J (2011) https://doi.org/10.1117/12.893805

KEYWORDS: Overlay metrology, Polarimetry, Error analysis, Semiconducting wafers, Metrology, Microelectronics, Optical imaging, Objectives, Photomasks, Process control

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SPIE Journal Paper | 1 July 2011

Overlay measurements by Mueller polarimetry in back focal plane

Clément Fallet, Tatiana Novikova, Martin Foldyna, Sandeep Manhas, Bicher Haj Ibrahim, Antonello De Martino, Cyril Vannuffel, Christophe Constancias

JM3, Vol. 10, Issue 03, 033017, (July 2011) https://doi.org/10.1117/12.10.1117/1.3626852

KEYWORDS: Overlay metrology, Polarimetry, Error analysis, Silicon, Semiconducting wafers, Metrology, Optical testing, Microscopes, Critical dimension metrology, Mueller matrices

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Proceedings Article | 20 June 2011 Paper

Towards a realistic numerical modeling of polarimetric response of healthy and pathological colon tissue

Maria Rosaria Antonelli, Angelo Pierangelo, Tatiana Novikova, Pierre Validire, Abdelali Benali, Brice Gayet, Antonello De Martino

Proceedings Volume 8087, 80872U (2011) https://doi.org/10.1117/12.896635

KEYWORDS: Tissues, Scattering, Colon, Monte Carlo methods, Optical spheres, Rayleigh scattering, Mie scattering, Polarimetry, Light scattering, Tissue optics

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Proceedings Article | 20 April 2011 Paper

Overlay measurements by Mueller polarimetry in the back focal plane

Tatiana Novikova, Clément Fallet, Martin Foldyna, Sandeep Manhas, Bicher Haj Ibrahim, Antonello De Martino, Cyril Vannuffel, Christophe Constancias

Proceedings Volume 7971, 797115 (2011) https://doi.org/10.1117/12.879499

KEYWORDS: Overlay metrology, Polarimetry, Metrology, Error analysis, Microscopes, Silicon, Critical dimension metrology, Manufacturing, Semiconducting wafers, Optical testing

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Proceedings Article | 1 March 2011 Paper

Use of Mueller polarimetric imaging for the staging of human colon cancer

Angelo Pierangelo, Sandeep Manhas, Abdelali Benali, Maria Rosaria Antonelli, Tatiana Novikova, Pierre Validire, Brice Gayet, Antonello De Martino

Proceedings Volume 7895, 78950E (2011) https://doi.org/10.1117/12.878248

KEYWORDS: Cancer, Tissues, Polarimetry, Colorectal cancer, Colon, Tumors, Polarization, Tissue optics, Light scattering, Scattering

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Proceedings Article | 24 August 2010 Paper

Applications of Mueller polarimetry in the Fourier space for overlay characterization in microelectronics

Clement Fallet, Sandeep Manhas, Antonello de Martino, Tatiana Novikova

Proceedings Volume 7767, 77670N (2010) https://doi.org/10.1117/12.862976

KEYWORDS: Overlay metrology, Polarimetry, Microelectronics, Silica, Statistical analysis, Objectives, Diffraction gratings, Microscopes, Process control, Metrology

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Proceedings Article | 26 April 2010 Paper

Contrast evaluation of the polarimetric images of different targets in turbid medium: possible sources of systematic errors

T. Novikova, A. Bénière, F. Goudail, A. De Martino

Proceedings Volume 7672, 76720Q (2010) https://doi.org/10.1117/12.849907

KEYWORDS: Scattering, Polarization, Polarimetry, Light scattering, Particles, Linear polarizers, Optical properties, Monte Carlo methods, Anisotropy, Target detection

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Proceedings Article | 2 April 2010 Paper

Stability of polarimetric grating characterization with beam spot larger than grating box

M. Foldyna, C. Licitra, A. De Martino

Proceedings Volume 7638, 76381I (2010) https://doi.org/10.1117/12.846445

KEYWORDS: Mueller matrices, Polarimetry, Matrices, Data modeling, Optical filters, Semiconducting wafers, Superposition, Reflectivity, Magnesium, Statistical analysis

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Proceedings Article | 2 April 2010 Paper

Robust characterization of small grating boxes using rotating stage Mueller matrix polarimeter

M. Foldyna, A. De Martino, C. Licitra, J. Foucher

Proceedings Volume 7638, 763803 (2010) https://doi.org/10.1117/12.846234

KEYWORDS: Polarimetry, Statistical analysis, 3D modeling, Semiconducting wafers, Critical dimension metrology, Scanning electron microscopy, Error analysis, Data modeling, Diffraction gratings, Mueller matrices

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Proceedings Article | 4 December 2008 Paper

Characterization of inhomogeneous samples by spectroscopic Mueller polarimetry

M. Foldyna, A. De Martino, R. Ossikovski, E. Garcia-Caurel, D. Cattelan, C. Licitra

Proceedings Volume 7140, 71400J (2008) https://doi.org/10.1117/12.804690

KEYWORDS: Polarimetry, Mueller matrices, Data modeling, Diffraction gratings, Silicon, Statistical modeling, Photoresist materials, Spectroscopy, Metrology, Lithography

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Proceedings Article | 1 December 2008 Paper

Accurate dimensional characterization of periodic structures by spectroscopic Mueller polarimetry

M. Foldyna, A. De Martino, D. Cattelan, F. Bogeat, C. Licitra, J. Foucher, P. Barritault, J. Hazart

Proceedings Volume 7140, 71400I (2008) https://doi.org/10.1117/12.804682

KEYWORDS: Atomic force microscopy, Data modeling, Critical dimension metrology, Polarimetry, Diffraction gratings, Silicon, Spectroscopy, 3D metrology, Scatterometry, Error analysis

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Proceedings Article | 16 April 2008 Paper

Comparison of spectroscopic Mueller polarimetry, standard scatterometry, and real space imaging techniques (SEM and 3D-AFM) for dimensional characterization of periodic structures

A. De Martino, M. Foldyna, T. Novikova, D. Cattelan, P. Barritault, C. Licitra, J. Hazart, J. Foucher, F. Bogeat

Proceedings Volume 6922, 69221P (2008) https://doi.org/10.1117/12.772721

KEYWORDS: Atomic force microscopy, Data modeling, Polarimetry, Critical dimension metrology, Diffraction gratings, 3D metrology, Spectroscopic ellipsometry, Silicon, Spectroscopy, 3D imaging standards

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Proceedings Article | 12 April 2007 Paper

Optics of nanogratings

M. Foldyna, K. Postava, R. Ossikovski, A. De Martino, E. Garcia-Caurel, B. Drevillon, J. Pištora, T. Yamaguchi

Proceedings Volume 6609, 660903 (2007) https://doi.org/10.1117/12.739345

KEYWORDS: Diffraction gratings, Refractive index, Dielectrics, Optical properties, Absorption, Electro optical modeling, Diffraction, Oscillators, Data modeling, Metals

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Proceedings Article | 5 April 2007 Paper

Metrology of replicated diffractive optics with Mueller polarimetry in conical diffraction

Tatiana Novikova, Antonello De Martino, Pavel Bulkin, Quang Nguyen, Bernard Drévillon, Vladimir Popov, Alexander Chumakov

Proceedings Volume 6518, 65184E (2007) https://doi.org/10.1117/12.711401

KEYWORDS: Diffraction gratings, Atomic force microscopy, Polarimetry, Nickel, Metrology, Diffraction, Solids, Spectroscopy, Holograms, Electroplating

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Proceedings Article | 5 April 2007 Paper

Mueller polarimetry in the back focal plane

A. De Martino, S. Ben Hatit, M. Foldyna

Proceedings Volume 6518, 65180X (2007) https://doi.org/10.1117/12.708627

KEYWORDS: Objectives, Diffraction gratings, Calibration, Polarimetry, Diffraction, Dichroic materials, Microscopes, Polarization, Charge-coupled devices, Mueller matrices

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Proceedings Article | 24 March 2006 Paper

Decorrelation of fitting parameters by Mueller polarimetry in conical diffraction

Antonello De Martino, Tatiana Novikova, Christophe Arnold, Sami BenHatit, Bernard Drévillon

Proceedings Volume 6152, 61521H (2006) https://doi.org/10.1117/12.654834

KEYWORDS: Silica, Diffraction, Diffraction gratings, Polarimetry, Atomic force microscopy, Etching, Data modeling, Interfaces, Statistical modeling, Photoresist materials

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Proceedings Article | 10 May 2005 Paper

Characterization of gratings by Mueller polarimetry in conical diffraction

Antonello De Martino, Tatiana Novikova, Sami BenHatit, Bernard Drevillon, Denis Cattelan

Proceedings Volume 5752, (2005) https://doi.org/10.1117/12.600537

KEYWORDS: Diffraction, Diffraction gratings, Polarimetry, Mueller matrices, Cadmium sulfide, Metrology, Polarization, Calibration, Polysomnography, Silicon

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Proceedings Article | 13 July 2004 Paper

Polarized images of the cervix

Blandine Laude-Boulesteix, Andre Nazac, Gilles Le Naour, Catherine Genestie, Laurent Schwartz, Bernard Drevillon, Antonello De Martino

Proceedings Volume 5312, (2004) https://doi.org/10.1117/12.529011

KEYWORDS: Cervix, Tissues, Polarization, Light scattering, Imaging systems, Polarimetry, Linear polarizers, Liquid crystals, CCD cameras, Biopsy

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Proceedings Article | 13 July 2004 Paper

Mueller polarimetric microscopy

Blandine Laude-Boulesteix, Antonello De Martino, Gilles Le Naour, Catherine Genestie, Laurent Schwartz, Enric Garcia-Caurel, Bernard Drevillon

Proceedings Volume 5324, (2004) https://doi.org/10.1117/12.527975

KEYWORDS: Polarimetry, Collagen, Polarization, Liquid crystals, Birefringence, Calibration, Biopsy, Arteries, Polarizers, Linear polarizers

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Proceedings Article | 14 October 2003 Paper

A Mueller polarimetric imaging system for biomedical applications

Blandine Laude, Antonello De Martino, Gilles Le Naour, Catherine Genestie, Andre Nazac, Steve Guyot, Bernard Clairac, Enric Garcia Caurel, Bernard Drevillon, Laurent Schwartz

Proceedings Volume 5143, (2003) https://doi.org/10.1117/12.500670

KEYWORDS: Polarimetry, Liquid crystals, Calibration, Polarization, Biopsy, Collagen, Tissues, Polysomnography, CCD cameras, Liver

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Proceedings Article | 15 May 2002 Paper

Three-dimensional microscopy through white light interferometry

Blandine Laude, Antonello De Martino, Bernard Drevillon, L Benattar, Laurent Schwartz

Proceedings Volume 4621, (2002) https://doi.org/10.1117/12.467829

KEYWORDS: Tomography, Optical coherence tomography, Microscopes, Interferometry, Mirrors, Microscopy, Charge-coupled devices, Cornea, Optical interferometry, CCD cameras

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Proceedings Article | 2 November 2001 Paper

Full-field OCT with thermal light

Antonello De Martino, David Carrara, Bernard Drevillon, Laurent Schwartz

Proceedings Volume 4431, (2001) https://doi.org/10.1117/12.447398

KEYWORDS: Optical coherence tomography, Tomography, Microscopes, Interferometry, Mirrors, Spectral resolution, Objectives, Charge-coupled devices, CCD cameras, Light sources

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Showing 5 of 26 publications

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