Ayush Kumar
at Nanotronics
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 20 August 2020 Presentation + Paper
Tonislav Ivanov, Ayush Kumar, Denis Sharoukhov, Francis Ortega, Matthew Putman
Proceedings Volume 11511, 1151107 (2020) https://doi.org/10.1117/12.2568986
KEYWORDS: Signal to noise ratio, Data modeling, Denoising, Performance modeling, Statistical modeling, Data acquisition, Microscopy

Proceedings Article | 20 August 2020 Presentation + Paper
Tonislav Ivanov, Ayush Kumar, Denis Sharoukhov, Francis Ortega, Matthew Putman
Proceedings Volume 11511, 1151103 (2020) https://doi.org/10.1117/12.2568990
KEYWORDS: Semiconducting wafers, Microscopes, Neural networks, Inspection, Wafer inspection, Systems modeling, Microscopy, Data modeling, Visual process modeling

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