Brian K. Blakkolb
at Jet Propulsion Lab
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 8 September 2010 Paper
Philip Carey, Brian Blakkolb
Proceedings Volume 7794, 779408 (2010) https://doi.org/10.1117/12.860204
KEYWORDS: Particles, Contamination, Fluctuations and noise, Buildings, Failure analysis, Carbon, Gases, Atmospheric particles, Environmental monitoring, Semiconducting wafers

Proceedings Article | 2 September 2008 Paper
Brian Blakkolb, Ira Katz, Ioannis Mikellides
Proceedings Volume 7069, 70690G (2008) https://doi.org/10.1117/12.796092
KEYWORDS: Contamination, Mars, Diffusion, Solids, Turbulence, Atmospheric sensing, Systems modeling, Molecules, Carbon dioxide, Atmospheric sciences

Proceedings Article | 24 February 2003 Paper
Christopher Martin, Thomas Barlow, William Barnhart, Luciana Bianchi, Brian Blakkolb, Dominique Bruno, Joseph Bushman, Yong-Ik Byun, Michael Chiville, Timothy Conrow, Brian Cooke, Jose Donas, James Fanson, Karl Forster, Peter Friedman, Robert Grange, David Griffiths, Timothy Heckman, James Lee, Patrick Jelinsky, Sug-Whan Kim, Siu-Chun Lee, Young-Wook Lee, Dankai Liu, Barry Madore, Roger Malina, Alan Mazer, Ryan McLean, Bruno Milliard, William Mitchell, Marco Morais, Patrick Morrissey, Susan Neff, Frederic Raison, David Randall, Michael Rich, David Schiminovich, Wes Schmitigal, Amit Sen, Oswald Siegmund, Todd Small, Joseph Stock, Frank Surber, Alexander Szalay, Arthur Vaughan, Timothy Weigand, Barry Welsh, Patrick Wu, Ted Wyder, C. Kevin Xu, Jennifer Zsoldas
Proceedings Volume 4854, (2003) https://doi.org/10.1117/12.460034
KEYWORDS: Sensors, Galactic astronomy, Space operations, Ultraviolet radiation, Imaging spectroscopy, Space telescopes, Telescopes, Spectroscopy, Satellites, Electronics

Proceedings Article | 27 October 1998 Paper
Phil Whitesmith, Brian Blakkolb
Proceedings Volume 3427, (1998) https://doi.org/10.1117/12.328484
KEYWORDS: Image processing, Scanning electron microscopy, Image analysis, Particles, Binary data, Optical fibers, Digital imaging, Picture Archiving and Communication System, Silicon, Semiconducting wafers

Proceedings Article | 27 October 1998 Paper
Brian Blakkolb, Phil Whitesmith
Proceedings Volume 3427, (1998) https://doi.org/10.1117/12.328488
KEYWORDS: Particles, Scanners, Semiconducting wafers, Space operations, Scanning electron microscopy, Contamination, Silicon, Data modeling, Contamination control, Image processing

Showing 5 of 6 publications
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