Dr. Christopher J. Chunnilall Profile

Dr. Christopher J. Chunnilall

at National Physical Lab

SPIE Involvement:

Author

Publications (19)

Proceedings Article | 19 July 2023 Presentation

Towards the quantum candela: a calibrated flux of five million single photons per second delivered by a single-mode fiber

Rachel Clark, Petros Androvitsaneas, Luke Arabskyj, Philip Dolan, Ted Santana, Christopher Chunnilall, Alastair Sinclair, Ian Farrer, Anthony Bennett

Proceedings Volume PC12633, PC126330K (2023) https://doi.org/10.1117/12.2671755

KEYWORDS: Photons, Single mode fibers, Calibration, Single photon detectors, Quantum measurement, Quantum dots, Nanotechnology, Fluorescence, Superconductors, Silicon

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Proceedings Article | 21 May 2018 Paper

European coordinated metrological effort for quantum cryptography

M. Gramegna, I. Ruo Berchera, S. Kueck, G. Porrovecchio, C. Chunnilall, I. Degiovanni, M. Lopez, R. Kirkwood, T. Kübarsepp, A. Pokatilov, N. Castagna, J. Morel, F. Manoocheri , A. Vaigu

Proceedings Volume 10674, 106741K (2018) https://doi.org/10.1117/12.2307841

KEYWORDS: Quantum key distribution, Metrology, Telecommunications, Information security, Quantum communications, Quantum cryptography, Optical components, Single photon detectors, Standards development, Radiometry

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Proceedings Article | 21 May 2018 Presentation + Paper

Measurements towards providing security assurance for a chip-scale QKD system

A. Vaquero-Stainer, R. Kirkwood, V. Burenkov, C. Chunnilall, A. Sinclair, A. Hart, H. Semenenko, P. Sibson, C. Erven, M. Thompson

Proceedings Volume 10674, 106741A (2018) https://doi.org/10.1117/12.2307409

KEYWORDS: Quantum key distribution, Transmitters, Receivers, Information security

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SPIE Journal Paper | 13 August 2014 Open Access

Errata: Metrology of single-photon sources and detectors: a review

Christopher Chunnilall, Ivo Pietro Degiovanni, Stefan Kück, Ingmar Müller, Alastair Sinclair

OE, Vol. 53, Issue 08, 089801, (August 2014) https://doi.org/10.1117/12.10.1117/1.OE.53.8.089801

KEYWORDS: Metrology, Sensors, Nanolithography, Roads, Optical engineering

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SPIE Journal Paper | 10 July 2014 Open Access

Metrology of single-photon sources and detectors: a review

Christopher Chunnilall, Ivo Pietro Degiovanni, Stefan Kück, Ingmar Müller, Alastair Sinclair

OE, Vol. 53, Issue 08, 081910, (July 2014) https://doi.org/10.1117/12.10.1117/1.OE.53.8.081910

KEYWORDS: Sensors, Single photon detectors, Metrology, Photodetectors, Quantum key distribution, Signal detection, Single photon, Calibration, Quantum efficiency, Surface plasmons

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Proceedings Article | 29 October 2013 Paper

Towards a high-speed quantum random number generator

Damien Stucki, Samuel Burri, Edoardo Charbon, Christopher Chunnilall, Alessio Meneghetti, Francesco Regazzoni

Proceedings Volume 8899, 88990R (2013) https://doi.org/10.1117/12.2029287

KEYWORDS: Sensors, Metrology, Matrices, Clocks, Cryptography, Numerical simulations, Quantum physics, Field programmable gate arrays, Beam splitters, Information security

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Proceedings Article | 28 April 2010 Paper

Characterisation of photon counting systems at NPL

Evangelos Theocharous, Jessica Cheung, Christopher Chunnilall

Proceedings Volume 7681, 768105 (2010) https://doi.org/10.1117/12.851861

KEYWORDS: Photon counting, Sensors, Nanolithography, Photodetectors, Silicon, Indium gallium arsenide, Calibration, Signal detection, Optical metrology, Photodiodes

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Proceedings Article | 11 May 2007 Paper

Photon counting: measurement challenges

Jessica Cheung, Christopher Chunnilall, Peter Thomas, John Mountford, Nigel Fox

Proceedings Volume 6583, 65830G (2007) https://doi.org/10.1117/12.724818

KEYWORDS: Sensors, Photon counting, Quantum efficiency, Electronics, Luminescence, Photomultipliers, Photodiodes, Photodetectors, Quantum cryptography, Signal detection

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Proceedings Article | 18 August 2005 Paper

Developments in the realization of diffuse reflectance scales at NPL

Christopher Chunnilall, Frank Clarke, Michael Shaw

Proceedings Volume 5880, 58800V (2005) https://doi.org/10.1117/12.620268

KEYWORDS: Sensors, Reflectivity, Spectrometers, Reflectometry, Error analysis, Mirrors, Diffuse reflectance spectroscopy, Nanolithography, Fourier transforms, Indium gallium arsenide

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Proceedings Article | 19 October 2004 Paper

Radiometric applications of correlated photon metrology

Jessica Cheung, Christopher Chunnilall, Jian Wang

Proceedings Volume 5551, (2004) https://doi.org/10.1117/12.561294

KEYWORDS: Sensors, Quantum efficiency, Calibration, Photodetectors, Metrology, Optical components, Photon counting, Nanolithography, Silicon, Radio optics

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Proceedings Article | 3 February 2004 Paper

Jessica Cheung, Martin Vaughan, John Mountford, Christopher Chunnilall

Proceedings Volume 5161, (2004) https://doi.org/10.1117/12.511956

KEYWORDS: Sensors, Crystals, Transmittance, Optical filters, Quantum efficiency, Photodetectors, Nanolithography, Metrology, Optical components, Calibration

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Proceedings Article | 14 November 2003 Paper

Recent progress at NPL in the development of mid-infrared spectrometric measurements

Frank Clarke, Christopher Chunnilall, Leon Rogers

Proceedings Volume 5192, (2003) https://doi.org/10.1117/12.509177

KEYWORDS: Reflectivity, Nanolithography, Reflectometry, Mirrors, Calibration, Spectrometers, Transmittance, Fourier transforms, Mid-IR, Reflection

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Proceedings Article | 14 November 2003 Paper

Goniometric realization of reflectance scales at NPL

Christopher Chunnilall, Michael Shaw

Proceedings Volume 5192, (2003) https://doi.org/10.1117/12.509190

KEYWORDS: Reflectivity, Nanolithography, Diffuse reflectance spectroscopy, Integrating spheres, Calibration, Barium, Reflectometry, Mid-IR, Aluminum, Ultraviolet radiation

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Proceedings Article | 14 November 2003 Paper

The prediction of lifetime failure of thermal barrier coatings using piezospectroscopic techniques

Christopher Chunnilall, James Banks, Guofeng Chen, Jessica Cheung, Stuart Saunders

Proceedings Volume 5192, (2003) https://doi.org/10.1117/12.509186

KEYWORDS: Luminescence, Chromium, Raman spectroscopy, Ions, Nondestructive evaluation, Calibration, Spectroscopy, Zirconium dioxide, Crystals, Oxidation

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Proceedings Article | 8 August 2003 Paper

NPL-NRC comparison of mid-infrared regular transmittance

Christopher Chunnilall, Frank Clarke, Nelson Rowell

Proceedings Volume 4826, (2003) https://doi.org/10.1117/12.514478

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Proceedings Article | 8 August 2003 Paper

Diffuse reflectance scales at NPL

Christopher Chunnilall, Frank Clarke, Michael Shaw

Proceedings Volume 4826, (2003) https://doi.org/10.1117/12.514535

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Proceedings Article | 8 November 1996 Paper

High-accuracy characterization and applications of filter radiometers

Nigel Fox, Christopher Chunnilall, Neil Harrison, William Hartree

Proceedings Volume 2815, (1996) https://doi.org/10.1117/12.257158

KEYWORDS: Radiometry, Optical filters, Sensors, Calibration, Black bodies, Standards development, Integrating spheres, Radio optics, Fourier transforms, Optical spheres

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Proceedings Article | 8 November 1996 Paper

Optimization of filter radiometer spectral response

Alexander Prokhorov, Christopher Chunnilall, Nigel Fox, Sergei Mekhontsev, Victor Sapritsky

Proceedings Volume 2815, (1996) https://doi.org/10.1117/12.257151

KEYWORDS: Optical filters, Glasses, Composites, Transmittance, Radiometry, Absorption filters, Software development, Sensors, Optical testing, Optimization (mathematics)

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Proceedings Article | 31 January 1994 Paper

Dispersive far-infrared Fourier transform spectrometer

Christopher Chunnilall, William Sherman

Proceedings Volume 2089, (1994) https://doi.org/10.1117/12.166574

KEYWORDS: Mirrors, Spectroscopy, Fourier transforms, Sensors, Interferometers, Infrared spectroscopy, Phase measurement, Composites, Phase shift keying, FT-IR spectroscopy

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Showing 5 of 19 publications

Conference Committee Involvement (1)

Optical Diagnostic Methods for Inorganic Materials III

6 August 2003 | San Diego, California, United States

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