Dr. Chun-ling Liu Profile

Dr. Chun-ling Liu

at Jilin Normal Univ

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Author

Publications (6)

Proceedings Article | 16 November 2010 Paper

Improvement of OLED properties with the AlN insulated layer

Wenlong Jiang, Jin Wang, Lei Zhao, Chunling Liu, Chunwu Wang

Proceedings Volume 7852, 78521G (2010) https://doi.org/10.1117/12.871371

KEYWORDS: Aluminum nitride, Organic light emitting diodes, Energy efficiency, Dielectrics, Aluminum, Electron transport, Thin films, Interfaces, Oxides, Coating

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Proceedings Article | 16 November 2010 Paper

Improvement of OLED properties with anti-reflection coatings

Wenlong Jiang, Dongmei Wang, Chunwu Wang, Lei Zhao, Zhengkun Qin, Chunling Liu

Proceedings Volume 7852, 78521F (2010) https://doi.org/10.1117/12.871364

KEYWORDS: Antireflective coatings, Organic light emitting diodes, Coating, Energy efficiency, Glasses, Aluminum, Transmittance, Electroluminescence, Corundum, Titanium dioxide

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Proceedings Article | 13 November 2010 Paper

Hydrogen and argon plasma passivation technology in GaAs/AlGaAs LD cavity surfaces

Yanping Yao, Chunwu Wang, Chunling Liu

Proceedings Volume 7844, 784419 (2010) https://doi.org/10.1117/12.871677

KEYWORDS: Argon, Plasma, Hydrogen, Gallium arsenide, Argon ion lasers, Semiconductor lasers, Laser damage threshold, Oxides, Laser resonators, Laser applications

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Proceedings Article | 24 January 2008 Paper

Study on microstructure of amorphous GaAs and hydrogen doped amorphous GaAs thin films

Chunling Liu, Yanping Yao, Baoxue Bo

Proceedings Volume 6829, 68291C (2008) https://doi.org/10.1117/12.754989

KEYWORDS: Hydrogen, Gallium arsenide, Thin films, Chemical species, Absorption, X-ray diffraction, Infrared radiation, Sputter deposition, Correlation function, Scanning electron microscopy

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Proceedings Article | 4 January 2008 Paper

Process investigation of a-Si:H thin films prepared by DC magnetron sputtering

Chunwu Wang, Baoxue Bo, Chunling Liu, Yanping Yao, Yuxia Wang

Proceedings Volume 6825, 682514 (2008) https://doi.org/10.1117/12.754917

KEYWORDS: Hydrogen, Sputter deposition, Refractive index, Thin films, Argon, Amorphous silicon, FT-IR spectroscopy, Spectroscopy, Silicon films, Silicon

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Showing 5 of 6 publications

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