David W. Allen
at Propulsor Technology Inc
SPIE Involvement:
Author
Publications (2)

SPIE Journal Paper | 9 July 2012
David Allen, Jacob Reiser, James Machin, Michael Koehler, Craig Madden
JEI, Vol. 21, Issue 3, 033002, (July 2012) https://doi.org/10.1117/12.10.1117/1.JEI.21.3.033002
KEYWORDS: Inspection, Image registration, Manufacturing, Linear filtering, Image sensors, Smoothing, Shape analysis, Sensors, Image restoration, Diffusion

Proceedings Article | 19 January 2009 Paper
David Allen, Jacob Reiser, James Machin, Craig Madden
Proceedings Volume 7239, 72390K (2009) https://doi.org/10.1117/12.805407
KEYWORDS: Image registration, Silicon, Inspection, Manufacturing, Image sensors, Bismuth, Sensors, Evolutionary algorithms, Design for manufacturability, Detection and tracking algorithms

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