Dr. David C. Deisenroth
at National Institute of Standards and Technology
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 20 August 2020 Presentation + Paper
Proceedings Volume 11485, 114850K (2020) https://doi.org/10.1117/12.2568179
KEYWORDS: Reflectometry, Reflectivity, Imaging systems, Light emitting diodes, Point spread functions, Deconvolution, Staring arrays, Stray light, Signal attenuation

Proceedings Article | 2 March 2020 Paper
Proceedings Volume 11271, 112710L (2020) https://doi.org/10.1117/12.2547491
KEYWORDS: Energy transfer, Absorption, Reflectometry, Laser energy, Metals, Liquids, Laser welding, Reflection, Calorimetry

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