Dr. David T. Mathes Profile

Dr. David T. Mathes

Engineer at II-VI Incorporated

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Author

Publications (7)

Proceedings Article | 29 January 2008 Paper

Developments at Finisar AOC

James Guenter, David Mathes, Bobby Hawkins, Jim Tatum

Proceedings Volume 6908, 690805 (2008) https://doi.org/10.1117/12.771311

KEYWORDS: Vertical cavity surface emitting lasers, Reliability, Semiconducting wafers, Failure analysis, Chemical elements, Data communications, Manufacturing, Mirrors, Oxides, Transmission electron microscopy

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Proceedings Article | 10 February 2006 Paper

AOC moving forward: the impact of materials behavior

David Mathes, Jim Guenter, Jim Tatum, Ralph Johnson, Bobby Hawkins, Chris Johnson, Bobby Hawthorne

Proceedings Volume 6132, 613203 (2006) https://doi.org/10.1117/12.646447

KEYWORDS: Vertical cavity surface emitting lasers, Failure analysis, Reliability, Transmission electron microscopy, Oxides, Quantum wells, Manufacturing, Materials analysis, Laser manufacturing, Data communications

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Proceedings Article | 14 March 2005 Paper

A plot twist: the continuing story of VCSELs at AOC

James Guenter, Jim Tatum, Robert Hawthorne, Ralph Johnson, David Mathes, Bobby Hawkins

Proceedings Volume 5737, (2005) https://doi.org/10.1117/12.601831

KEYWORDS: Vertical cavity surface emitting lasers, Reliability, Oxides, Failure analysis, Manufacturing, Laser damage threshold, Code division multiplexing, Radio over Fiber, Eye, Mirrors

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Proceedings Article | 16 June 2004 Paper

VCSELs at Honeywell: The story continues

James Guenter, Jim Tatum, Robert Hawthorne, Bobby Hawkins, David Mathes

Proceedings Volume 5364, (2004) https://doi.org/10.1117/12.540129

KEYWORDS: Vertical cavity surface emitting lasers, Reliability, Manufacturing, Failure analysis, Control systems, Transceivers, Oxides, Statistical modeling, Solids, Semiconducting wafers

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Proceedings Article | 17 June 2003 Paper

Nanoscale materials characterization of degradation in VCSELs

David Mathes, Robert Hull, Kent Choquette, Kent Geib, Andrew Allerman, James Guenter, Bobby Hawkins, Robert Hawthorne

Proceedings Volume 4994, (2003) https://doi.org/10.1117/12.482858

KEYWORDS: Vertical cavity surface emitting lasers, Oxides, Transmission electron microscopy, Image segmentation, Failure analysis, Gallium, Mirrors, Quantum wells, Resistance, Diffraction

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Proceedings Article | 17 June 2003 Paper

Long-wavelength VCSELs at Honeywell

Ralph Johnson, Virgil Blasingame, Jim Tatum, Bo-Su Chen, David Mathes, James Orenstein, Tzu-Yu Wang, Jin Kim, Ho-Ki Kwon, Jae-Hyun Ryou, Gyoungwon Park, Edith Kalweit, Helen Chanhvongsak, Mike Ringle, Terry Marta, Joe Gieske

Proceedings Volume 4994, (2003) https://doi.org/10.1117/12.488221

KEYWORDS: Vertical cavity surface emitting lasers, Quantum wells, Mirrors, Metalorganic chemical vapor deposition, Nitrogen, Aluminum, Gallium arsenide, Absorption, Semiconductors, Resistance

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Proceedings Article | 4 April 1997 Paper

Cavity structures for low-loss oxide-confined VCSELs

Kent Choquette, H. Hadley, Weng Chow, Hong Hou, Kent Geib, B. Hammons, D. Mathes, Robert Hull

Proceedings Volume 3003, (1997) https://doi.org/10.1117/12.271067

KEYWORDS: Vertical cavity surface emitting lasers, Oxides, Optical resonators, Laser damage threshold, Near field optics, Scattering, Laser scattering, Quantum wells, Mirrors, Oxidation

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Showing 5 of 7 publications

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