Dr. Doyoung Jang
at imec
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 23 March 2020 Presentation + Paper
Bilal Chehab, P. Weckx, J. Ryckaert, D. Jang, D. Verkest, A. Spessot
Proceedings Volume 11328, 1132807 (2020) https://doi.org/10.1117/12.2548573
KEYWORDS: Fin field effect transistors, Field effect transistors, Optical lithography, Metals, Extreme ultraviolet, Etching, Multiplexers, Dielectrics, Logic devices, Logic

Proceedings Article | 27 March 2019 Presentation + Paper
S. M. Yasser Sherazi, Miroslav Cupak, P. Weckx, O. Zografos, D. Jang, P. Debacker, D. Verkest, A. Mocuta, R. H. Kim, A. Spessot, J. Ryckaert
Proceedings Volume 10962, 1096202 (2019) https://doi.org/10.1117/12.2514569
KEYWORDS: Metals, Optical lithography, Fin field effect transistors, Extreme ultraviolet, Standards development, Silicon, Line edge roughness, Computer architecture, Process control

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