Fahid AlhuMaidi Algahtani
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 26 December 2013 Paper
Fahid Algahtani, Karthikram Thulasiram, Nashrul Nasir, Anthony Holland
Proceedings Volume 8923, 89235D (2013) https://doi.org/10.1117/12.2034057
KEYWORDS: Resistance, Modeling, Thin films, Finite element methods, Computer simulations, Computer engineering, Mechatronics, Analytical research, Statistical analysis, Semiconductors

Proceedings Article | 20 December 2013 Paper
S. Almalki, F. Algahtani, M. Blackford, M. Alnassar, B. Johnson, J. McCallum, A. Holland
Proceedings Volume 8923, 89235H (2013) https://doi.org/10.1117/12.2035093
KEYWORDS: Germanium, Transmission electron microscopy, Nickel, Ion implantation, Crystals, Ions, Process modeling, Diffraction, Heat treatments, Statistical modeling

Proceedings Article | 7 December 2013 Paper
F. Algahtani, M. Blackford, E. Pirogova, A. Holland
Proceedings Volume 8923, 89235A (2013) https://doi.org/10.1117/12.2034001
KEYWORDS: Nickel, Germanium, Crystals, Silicon, Transmission electron microscopy, Diffraction, Resistance, Metals, Interfaces, Heat treatments

Proceedings Article | 7 December 2013 Paper
Yue Pan, Aaron Collins, Fahid Algahtani, Patrick Leech, Geoffrey Reeves, Philip Tanner, Anthony Holland
Proceedings Volume 8923, 892356 (2013) https://doi.org/10.1117/12.2033910
KEYWORDS: Silicon carbide, Resistance, Nickel, Electrodes, Heat treatments, Semiconductors, Metals, Temperature metrology, Bessel functions, Nitrogen

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