Dr. Fabrice R. Michel Profile

Dr. Fabrice R. Michel

at AMOS AS

SPIE Involvement:

Author

Publications (13)

Proceedings Article | 12 July 2019 Open Access

Full-SiC derotator optics for METimage: preliminary design and verification approach

E. Renotte, C. Bastin, F. Bernard, A. Bernat, JM. Boitrel, M. Bougoin, C. Flebus, E. Gillain, P. Gloesener, A. Jago, G. Laffitte, F. Lemagne, D. Logut, F. Mallet, A. Mazzoli, F. Michel, M. Pfaffe, M. Pinel, J. -M. Schumacher, F. Wolfs

Proceedings Volume 11180, 111808G (2019) https://doi.org/10.1117/12.2536223

KEYWORDS: Mirrors, Silicon carbide, Optical alignment, Optics manufacturing, Thermography, Coating, Defense and security, Chemical vapor deposition, Geometrical optics, Integrated optics

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SPIE Journal Paper | 9 August 2013

Combining shearography and interferometric fringe projection in a single device for complete control of industrial applications

Pascal Blain, Fabrice Michel, Pierre Piron, Yvon Renotte, Serge Habraken

OE, Vol. 52, Issue 08, 084102, (August 2013) https://doi.org/10.1117/12.10.1117/1.OE.52.8.084102

KEYWORDS: Shearography, Polarization, Interferometers, Interferometry, CCD cameras, Coating, Wave plates, Optical testing, Phase shifts, Control systems

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Proceedings Article | 17 September 2012 Paper

The 3,6 m Indo-Belgian Devasthal Optical Telescope: assembly, integration and tests at AMOS

Nathalie Ninane, Christian Bastin, Jonathan de Ville, Fabrice Michel, Maxime Pierard, Eric Gabriel, Carlo Flebus, Amitesh Omar

Proceedings Volume 8444, 84442U (2012) https://doi.org/10.1117/12.925927

KEYWORDS: Telescopes, Mirrors, Monochromatic aberrations, Stars, Active optics, Optical fabrication, Wavefronts, Optical telescopes, Optical instrument design, Image quality

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Proceedings Article | 28 April 2012 Paper

Carrier and aberrations removal in interferometric fringe projection profilometry

P. Blain, F. Michel, Y. Renotte, S. Habraken

Proceedings Volume 8430, 84300O (2012) https://doi.org/10.1117/12.922533

KEYWORDS: Phase measurement, Interferometry, Calibration, Monochromatic aberrations, Zernike polynomials, Projection systems, Cameras, Wavefronts, Fringe analysis, Geometrical optics

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SPIE Journal Paper | 6 April 2012

Measurement of the defect size by shearography or other interferometric techniques

Fabrice Michel, Yvon Renotte, Serge Habraken

OE, Vol. 51, Issue 03, 033602, (April 2012) https://doi.org/10.1117/12.10.1117/1.OE.51.3.033602

KEYWORDS: Wavelets, Shearography, Interferometry, Wavelet transforms, Error analysis, Nondestructive evaluation, Optical engineering, Defect detection, Algorithm development, Interferometers

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Proceedings Article | 2 August 2010 Paper

Using a Savart plate in optical metrology

P. Blain, F. Michel, Y. Renotte, S. Habraken

Proceedings Volume 7791, 779107 (2010) https://doi.org/10.1117/12.860177

KEYWORDS: Interferometers, Shearography, Polarization, Light sources and illumination, CCD cameras, Optical testing, Projection systems, Defect detection, Interferometry, Structured light

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Proceedings Article | 18 May 2010 Paper

Comparison of spectral colorimetric measurements vs. color pictures in dermatology

P. Blain, F. Michel, V, Moreau, O. Vanhooteghem, Y. Renotte, S. Habraken

Proceedings Volume 7715, 77152P (2010) https://doi.org/10.1117/12.854477

KEYWORDS: RGB color model, 3D modeling, 3D acquisition, Dermatology, Cameras, Reflectivity, Calibration, Light sources, Interferometry, Sensors

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Proceedings Article | 5 August 2009 Paper

Nondestructive testing by digital shearography using a Savart plate

F. Michel, P. Blain, E. Auger, Y. Renotte, S. Habraken

Proceedings Volume 7386, 73861O (2009) https://doi.org/10.1117/12.839676

KEYWORDS: Interferometers, Polarization, Shearography, Prisms, Nondestructive evaluation, Phase shifts, Geometrical optics, Crystals, Linear polarizers, Optics manufacturing

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SPIE Journal Paper | 1 October 2007

Almost-common path interferometer using the separation of polarization states for digital phase-shifting shearography

Vanessa Rosso, Yvon Renotte, Serge Habraken, Yves Lion, Fabrice Michel, Vincent Moreau, Bernard Tilkens

OE, Vol. 46, Issue 10, 105601, (October 2007) https://doi.org/10.1117/12.10.1117/1.2795632

KEYWORDS: Interferometers, Prisms, Glasses, Shearography, Wave plates, Polarization, Phase shifts, Liquid crystals, Coating, Modulators

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Proceedings Article | 18 June 2007 Paper

Quantification of defect size in shearing direction by shearography and wavelet transform

Fabrice Michel, Vincent Moreau, Vanessa Rosso, Serge Habraken, Bernard Tilkens

Proceedings Volume 6616, 661636 (2007) https://doi.org/10.1117/12.725997

KEYWORDS: Wavelets, Shearography, Wavelet transforms, Defect detection, Interferometry, Nondestructive evaluation, Infrared radiation, Interferometers, Phase shifts, Speckle interferometry

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Proceedings Article | 15 September 2006 Paper

An almost-common path shearographic interferometer using the separation of the polarization states

Vanessa Rosso, Fabrice Michel, Vincent Moreau, Yvon Renotte, Bernard Tilkens, Yves Lion

Proceedings Volume 6341, 63411I (2006) https://doi.org/10.1117/12.695374

KEYWORDS: Interferometers, Glasses, Prisms, Polarization, Shearography, Wave plates, Coating, Liquid crystals, Phase shifts, Modulators

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Proceedings Article | 8 September 2006 Paper

Out-of-plane displacement derivative measurement: comparison of results obtained by a shearographic interferometer using the separation of the polarization states and the finite element method

Vanessa Rosso, Lihong Zhang, Fabrice Michel, Yvon Renotte, Yves Lion, Anne-Marie Habraken

Proceedings Volume 6343, 634327 (2006) https://doi.org/10.1117/12.707948

KEYWORDS: Shearography, Interferometers, Finite element methods, Polarization, Prisms, Wave plates, Glasses, Liquid crystals, Phase shifts, Coating

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Proceedings Article | 14 October 2005 Paper

Highlighting properties of filters for their application in temporal phase shifting interferometry

Vanessa Rosso, Fabrice Michel, Vincent Moreau, Yvon Renotte, Bernard Tilkens, Yves Lion

Proceedings Volume 5969, 59692M (2005) https://doi.org/10.1117/12.629913

KEYWORDS: Digital filtering, Gaussian filters, Image filtering, Phase interferometry, Optical filters, Interferometry, Spatial frequencies, Speckle pattern, Shearography, Electronic filtering

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Showing 5 of 13 publications

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