Prof. Franck Delmotte Profile

Prof. Franck Delmotte

Professor at Institut d'Optique Graduate School

SPIE Involvement:

Conference Program Committee | Author

Publications (36)

Proceedings Article | 7 June 2023 Presentation + Paper

Development of multilayer gratings for Solar-C EUV spectro-imager

A. H. Mahmoud, S. de Rossi, E. Meltchakov, E. Papagiannouli, B. Capitanio, M. Thomasset, A. Philippon, F. Auchère, F. Delmotte

Proceedings Volume 12576, 1257608 (2023) https://doi.org/10.1117/12.2665459

KEYWORDS: Extreme ultraviolet, Diffraction gratings, Multilayers, Atomic force microscopy, X-rays, Reflectivity, Optical gratings, Diffraction, Synchrotrons, Surface roughness

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Proceedings Article | 6 June 2023 Presentation

Recent advances in EUV multilayer optics for solar physics and ultra-fast science applications (Conference Presentation)

Franck Delmotte, Evgueni Meltchakov, Sébastien de Rossi, Charles Bourassin-Bouchet, Eirini Papagiannouli, Arnaud Jérôme, Amr H. Mahmoud

Proceedings Volume 12578, 125780F (2023) https://doi.org/10.1117/12.2670923

KEYWORDS: Multilayers, Extreme ultraviolet, Ultrafast phenomena, Solar processes, EUV optics, Telescopes, Optical coatings, Mirrors, X-ray lasers, Optical properties

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Proceedings Article | 28 April 2023 Presentation + Paper

EUV refractive index measurements with improved accuracy and their impact in component modeling

Franck Delmotte, Eirini Papagiannouli, Catherine Burcklen, Farhad Salmassi, Eric Gullikson, Regina Soufli

Proceedings Volume 12494, 1249409 (2023) https://doi.org/10.1117/12.2660664

KEYWORDS: Refractive index, Transmittance, Chromium, Extreme ultraviolet, Thin films, Reflectivity, Contamination, Film thickness, Multilayers

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Proceedings Article | 6 July 2018 Presentation + Paper

The EUI flight instrument of Solar Orbiter: from optical alignment to end-to-end calibration

W. Schmutz, R. Aznar Cuadrado, C. Dumesnil, M. Gyo, T. Kennedy, C. Verbeeck, J. Barbay, B. Giordanengo, K. Heerlein, A. Hermans, V. Hervier, L. Jacques, A. Mazzoli, S. Meining, A. Philippon, S. Roose, P. Smith, A. Gottwald, C. Laubis, X. Zhang, M.-L. Hellin, L. Rossi, F. Scholze, J.-P. Halain, P. Rochus, E. Renotte, F. Auchère, D. Berghmans, F. Delmotte, L. Harra, U. Schühle, L. Teriaca, R. Mercier, S. Gissot

Proceedings Volume 10699, 106990H (2018) https://doi.org/10.1117/12.2309339

KEYWORDS: Extreme ultraviolet, Calibration, Cameras, Mirrors, Optical alignment, Sensors, Telescopes, Interferometry, Fermium, Frequency modulation

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Proceedings Article | 5 June 2018 Paper

Analyses of tabulated optical constants for thin films in the EUV range and application to solar physics multilayer coatings

Jennifer Rebellato, Sébastien De Rossi, Xueyan Zhang, Frédéric Auchère, Evgueni Meltchakov, Franck Delmotte, Regina Soufli

Proceedings Volume 10691, 106911U (2018) https://doi.org/10.1117/12.2313346

KEYWORDS: Aluminum, Extreme ultraviolet, Multilayers, Molybdenum, Mirrors, Silicon carbide, Magnesium, Zirconium, Optical coatings, Absorption

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SPIE Journal Paper | 17 November 2017 Open Access

Study of Cr/Sc-based multilayer reflecting mirrors using soft x-ray reflectivity and standing wave-enhanced x-ray fluorescence (Erratum)

Meiyi Wu, Catherine Burcklen, Jean-Michel André, Karine Le Guen, Angelo Giglia, Konstantin Koshmak, Stefano Nannarone, Françoise Bridou, Evgueni Meltchakov, Sébastien de Rossi, Franck Delmotte, Philippe Jonnard

OE, Vol. 56, Issue 11, 119801, (November 2017) https://doi.org/10.1117/12.10.1117/1.OE.56.11.119801

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SPIE Journal Paper | 1 November 2017

Study of Cr/Sc-based multilayer reflecting mirrors using soft x-ray reflectivity and standing wave-enhanced x-ray fluorescence

OE, Vol. 56, Issue 11, 117101, (November 2017) https://doi.org/10.1117/12.10.1117/1.OE.56.11.117101

KEYWORDS: Reflectivity, Mirrors, X-rays, X-ray fluorescence spectroscopy, Interfaces, Chromium, Multilayers, Sputter deposition, Sensors, Luminescence

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Proceedings Article | 22 September 2015 Paper

Multilayer optics for coherent EUV/X-ray laser sources

F. Delmotte, Ch. Bourassin-Bouchet, S. de Rossi, E. Meltchakov, M. Dehlinger, F. Varnière, A. Jerome

Proceedings Volume 9589, 958907 (2015) https://doi.org/10.1117/12.2188048

KEYWORDS: Reflectivity, Mirrors, Multilayers, Aluminum, Silicon, Silicon carbide, Absorption, Laser sources, Scandium, Boron

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Proceedings Article | 21 September 2015 Paper

The extreme ultraviolet imager of solar orbiter: optical design and alignment scheme

J.-P. Halain, C. Dumesnil, A. Mazzoli, S. Meining, P. Rochus, E. Renotte, F. Auchère, U. Schühle, F. Delmotte, A. Philippon, R. Mercier, A. Hermans

Proceedings Volume 9604, 96040H (2015) https://doi.org/10.1117/12.2185631

KEYWORDS: Mirrors, Sensors, Optical alignment, Extreme ultraviolet, Interferometry, Imaging systems, Optical design, Staring arrays, Aluminum, Bandpass filters

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Proceedings Article | 21 September 2015 Paper

The extreme UV imager telescope on-board the Solar Orbiter mission: overview of phase C and D

J.-P. Halain, P. Rochus, E. Renotte, A. Hermans, L. Jacques, F. Auchère, D. Berghmans, L. Harra, U. Schühle, W. Schmutz, A. Zhukov, R. Aznar Cuadrado, F. Delmotte, C. Dumesnil, M. Gyo, T. Kennedy, P. Smith, J. Tandy, R. Mercier, C. Verbeeck

Proceedings Volume 9604, 96040G (2015) https://doi.org/10.1117/12.2185634

KEYWORDS: Scanning tunneling microscopy, Fermium, Frequency modulation, Instrument modeling, Extreme ultraviolet, Optical filters, Sensors, Space operations, Imaging systems, Manufacturing

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Proceedings Article | 5 September 2014 Paper

Phase characterization of attosecond multilayer mirrors: from EUV to soft x-rays

Franck Delmotte, Sébastien de Rossi, Charles Bourassin-Bouchet, Evgueni Meltchakov, Angelo Giglia, Stefano Nannarone

Proceedings Volume 9207, 92070K (2014) https://doi.org/10.1117/12.2061022

KEYWORDS: Mirrors, Extreme ultraviolet, X-rays, Reflectivity, X-ray characterization, Phase measurement, Silicon, Signal attenuation, Data modeling, Atomic, molecular, and optical physics

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Proceedings Article | 24 July 2014 Paper

The extreme UV imager of solar orbiter: from detailed design to flight model

J.-P. Halain, P. Rochus, E. Renotte, F. Auchère, D. Berghmans, L. Harra, U. Schühle, W. Schmutz, C. Dumesnil, F. Delmotte, R. Aznar Cuadrado, T. Kennedy, R. Mercier, M. Gyo, A. Hermans, L. Jacques, A. Mazzoli, L. Rossi, J. Tandy, P. Smith, K. Heerlein, S. Meining, B. Winter, M. Thome, A. Zhukov, F. Verbeeck

Proceedings Volume 9144, 914408 (2014) https://doi.org/10.1117/12.2055207

KEYWORDS: Sensors, Optical filters, Mirrors, Scanning tunneling microscopy, Cameras, Space operations, Mathematical modeling, Interfaces, Extreme ultraviolet, Imaging systems

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Proceedings Article | 26 September 2013 Paper

Development of multilayer coatings for solar orbiter EUV imaging telescopes

Franck Delmotte, Evgueni Meltchakov, Sébastien de Rossi, Françoise Bridou, Arnaud Jérome, Raymond Mercier, Frédéric Auchère, Xueyan Zhang, Bruno Borgo, Marc Roulliay, Cydalise Dumesnil, Serge François, Udo Strauch, François Varnière

Proceedings Volume 8862, 88620A (2013) https://doi.org/10.1117/12.2036050

KEYWORDS: Multilayers, Reflectivity, Extreme ultraviolet, Telescopes, Space telescopes, Synchrotrons, Aluminum, Mirrors, Deposition processes, Space operations

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Proceedings Article | 3 May 2013 Paper

Spectral filtering optimization of a measuring channel of an x-ray broadband spectrometer

Ph. Troussel, B. Villette, F. Delmotte, B. Emprin

Proceedings Volume 8777, 87771B (2013) https://doi.org/10.1117/12.2016832

KEYWORDS: Mirrors, Reflectivity, Chromium, Silica, Multilayers, X-rays, Silicon, Calibration, Optical filters, Sensors

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Proceedings Article | 3 May 2013 Paper

Single and multi-channel Al-based multilayer systems for space applications in EUV range

E. Meltchakov, S. De Rossi, R. Mercier, F. Varniere, A. Jérome, F. Auchere, X. Zhang, M. Roulliay, F. Delmotte

Proceedings Volume 8777, 87771C (2013) https://doi.org/10.1117/12.2017058

KEYWORDS: Multilayers, Reflectivity, Extreme ultraviolet, Iron, Aluminum, Solar processes, Mirrors, Space telescopes, Optical coatings, Telescopes

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Proceedings Article | 17 September 2012 Paper

The EUI instrument on board the Solar Orbiter mission: from breadboard and prototypes to instrument model validation

L. Harra, J.-P. Halain, D. Berghmans, W. Schmutz, C. Dumesnil, T. Appourchaux, D. Pfiffner, A. Zhukov, T. Kennedy, L. Rossi, F. Auchère, P. Smith, J. Tandy, A. BenMoussa, U. Schühle, F. Delmotte, E. Renotte, R. Mercier, P. Rochus

Proceedings Volume 8443, 844307 (2012) https://doi.org/10.1117/12.924343

KEYWORDS: Sensors, Extreme ultraviolet, Optical filters, Prototyping, Coating, Instrument modeling, Thermal modeling, Cameras, Mirrors, Sun

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Proceedings Article | 7 October 2011 Paper

Development of multilayer thin film filters for the full-sun imager on Solar Orbiter

Ali BenMoussa, Evgueni Meltchakov, Xueyan Zhang, Frédéric Auchère, Franck Delmotte

Proceedings Volume 8148, 81480N (2011) https://doi.org/10.1117/12.893355

KEYWORDS: Transmittance, Imaging systems, Optical filters, Multilayers, Thin films, Extreme ultraviolet, Aluminum, Visible radiation, Sun, Image filtering

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Proceedings Article | 5 October 2011 Paper

Aluminum based multilayers systems synthesized by ion beam sputtering for extreme UV

E. Meltchakov, A. Ziani, C. Le Paven-Thivet, M. Roulliay, K. Gasc, F. Bridou, A. Jérome, F. Delmotte

Proceedings Volume 8168, 81681S (2011) https://doi.org/10.1117/12.896433

KEYWORDS: Reflectivity, Aluminum, Ion beams, Mirrors, Sputter deposition, Multilayers, Extreme ultraviolet, Reflectometry, Ultraviolet radiation, X-rays

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Proceedings Article | 4 October 2011 Paper

Design, deposition, and characterization of multilayer mirrors for ultrashort pulses in the attosecond domain

Pascal Salières, Bertrand Carré, Zsolt Diveki, F. Delmotte, Thierry Ruchon, E. Meltchakov, C. Bourassin-Bouchet, S. de Rossi

Proceedings Volume 8168, 816817 (2011) https://doi.org/10.1117/12.902320

KEYWORDS: Mirrors, Reflectivity, Extreme ultraviolet, Synchrotrons, Molybdenum, Silicon, Ultrafast phenomena, Photons, Phase measurement, Absorption

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Proceedings Article | 4 October 2011 Paper

EUV reflectivity and stability of tri-component Al-based multilayers

F. Varniere, A. Ziani, F. Bridou, F. Delmotte, X. Zhang, E. Meltchakov, M. Roulliay, S. De Rossi, F. Auchere, Ch. Bourassin-Bouchet, A. Jérome

Proceedings Volume 8168, 816819 (2011) https://doi.org/10.1117/12.896577

KEYWORDS: Multilayers, Reflectivity, Extreme ultraviolet, Aluminum, Silicon carbide, Silicon, X-rays, Interfaces, Synchrotron radiation, Temperature metrology

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Proceedings Article | 28 September 2011 Paper

Development of supermirrors for high-resolution x-ray LMJ microscopes

R. Rosch, E. Meltchakov, D. Dennetiere, F. Bridou, C. Reverdin, F. Delmotte, H. Hartmann, Ph. Troussel

Proceedings Volume 8139, 81390C (2011) https://doi.org/10.1117/12.895944

KEYWORDS: Microscopes, Mirrors, Reflectivity, X-rays, X-ray imaging, Multilayers, Spatial resolution, Grazing incidence, Diagnostics, Imaging systems

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Proceedings Article | 18 February 2011 Paper

EUV multilayer optics for space science and ultrafast science

E. Meltchakov, F. Bridou, F. Delmotte, S. de Rossi, A. Ziani, A. Jérome, F. Varnière, C. Bourassin-Bouchet, F. Choueikani

Proceedings Volume 7995, 79952Q (2011) https://doi.org/10.1117/12.888199

KEYWORDS: Multilayers, Extreme ultraviolet, Reflectivity, Mirrors, Thin films, Silicon, EUV optics, X-rays, Molybdenum, Sputter deposition

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Proceedings Article | 30 April 2009 Paper

Optical, chemical, and depth characterization of Al/SiC periodic multilayers

C. Hecquet, A. Galtayries, J.-M. André, K. Le Guen, P. Jonnard, E. Meltchakov, F. Delmotte, M.-H. Hu

Proceedings Volume 7360, 73600O (2009) https://doi.org/10.1117/12.820913

KEYWORDS: Silicon, Aluminum, Silicon carbide, Multilayers, Molybdenum, Ions, Interfaces, X-rays, Reflectivity, Chemical species

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Proceedings Article | 3 April 2008 Paper

EUV near normal incidence collector development at SAGEM

Laurent Pinard, Nazario Morgado, Marie-Françoise Ravet-Krill, R. Mercier Ythier, Christophe Hecquet, X. Bozec, Elodie Roméo, Franck Delmotte, Benoît Sassolas, Raffaele Flaminio, Jean-Luc Montorio, Jean-Marie Mackowski, Christophe Michel, A. Rinchet, R. Geyl

Proceedings Volume 6921, 692135 (2008) https://doi.org/10.1117/12.787620

KEYWORDS: Reflectivity, Mirrors, Coating, Extreme ultraviolet, Plasma, Manufacturing, Polishing, Annealing, Grazing incidence, Silicon carbide

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Proceedings Article | 3 October 2007 Paper

HECOR: a HElium CORonagraphy aboard the Herschel sounding rocket

Jeffrey Newmark, Christophe Hecquet, Raymond Mercier, Jean-Christophe Leclec'h, Arnaud Jérome, Jean-Pierre Moalic, John Moses, Marie-Françoise Ravet-Krill, Franck Delmotte, Denis Barbet, Frédéric Auchère, Frédéric Rouesnel

Proceedings Volume 6689, 66890A (2007) https://doi.org/10.1117/12.751447

KEYWORDS: Coronagraphy, Reflectivity, Mirrors, Multilayers, Coating, Extreme ultraviolet, Helium, Solar processes, Rockets, Stray light

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Proceedings Article | 20 September 2007 Paper

SWAP: a novel EUV telescope for space weather

Tanguy Thibert, Bogdan Nicula, François Denis, Jean-Marc Defise, Anik De Groof, David Berghmans, Marie-Françoise Ravet, Jean-François Hochedez, Frank Delmotte, Jean-Philippe Halain, Pierre Rochus, Emmanuel Mazy, Udo Schühle, Jean-Hervé Lecat

Proceedings Volume 6689, 66890S (2007) https://doi.org/10.1117/12.731784

KEYWORDS: Extreme ultraviolet, Mirrors, Space telescopes, Sensors, Telescopes, Electronics, Space operations, Thermal modeling, Multilayers, Sun

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Proceedings Article | 20 September 2007 Paper

XUV optics for attosecond applications

J. P. Goddet, M. F. Ravet, J. Gautier, A. S. Morlens, S. Sebban, G. Rey, C. Valentin, F. Delmotte, P. Zeitoun, F. Bridou, E. Papalarazou

Proceedings Volume 6705, 67050C (2007) https://doi.org/10.1117/12.732424

KEYWORDS: Mirrors, Reflectivity, Holography, Holograms, Multilayers, Silicon, Extreme ultraviolet, Microscopy, Digital holography, X-rays

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Proceedings Article | 18 May 2007 Paper

Design, conception, and metrology of EUV mirrors for aggressive environments

André Rinchet, Christophe Hecquet, Françoise Bridou, Françoise Varnière, Frédéric Bourcier, Vincent Costes, Aurélie Hardouin, Marie-Françoise Ravet-Krill, Arnaud Jérôme, Jean-Michel Desmarres, Roland Geyl, Jacques Berthon, Franck Delmotte, Marc Roulliay

Proceedings Volume 6586, 65860X (2007) https://doi.org/10.1117/12.723483

KEYWORDS: Reflectivity, Extreme ultraviolet, Multilayers, Extreme ultraviolet lithography, Humidity, Annealing, Reflectometry, Silicon carbide, Silicon, Space operations

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The development of new high power EUV sources and EUV space imaging requires optics having specific properties which depend on applications and operating conditions. These both applications are very different in the working multilayers environment. For the high power sources, multilayers are submitted to short pulses with high energy peak whereas, for the space imaging, multilayers are submitted to continuous flux with low level. Moreover photon energy and environment for both applications may be different. The environment may affect structure and top layer contamination when optics are stored, handled, mounted on the final device and finally operating. Main environmental parameters investigated are temperature and humidity variation. One objective is the optimisation of multilayer coatings to offer the highest resistance under photonic, ionic fluxes and temperature cycle. This means that interfacial diffusion between thin layers and degradation of the capping layers have to be avoided or reduced. The present study relies with designing, depositing and testing different structures of multilayer coatings in order to minimise the influence of the environment. Multilayer coatings based on molybdenum, silicon and silicon carbide materials have been deposited by magnetron sputtering on silicon and zerodur substrates. Samples were submitted to radiations emitted by an EUV source at wavelength closed to 13.5 nm. Furthermore they were also submitted to thermal cycles and annealing under warm humidity in the aim to simulate extremes storage or handling conditions as space mission's conditions. The damages and the performance of the multilayers were evaluated by using grazing incidence reflectometry at 0.154 nm and EUV reflectometry at the operating wavelength. After a presentation of the multilayer design, deposition and metrology tools, we will describe the different environmental effects on the coatings to take in care during EUV source exposure, handling and storage conditions. First results on multilayers performances to EUV source exposure and space specification tests are presented. Main damages studies were on annealing, thermal cycling and warm humidity.

Proceedings Article | 5 October 2005 Paper

B4C/Mo/Si multilayers for 20–40 nm wavelengths: application to broadband mirrors

Francoise Bridou, Arnaud Jerome, Franck Delmotte, Julien Gautier, Marc Roulliay, Marie Francoise Ravet

Proceedings Volume 5963, 59631V (2005) https://doi.org/10.1117/12.625031

KEYWORDS: Reflectivity, Mirrors, Multilayers, Silicon, Molybdenum, Sputter deposition, Calibration, Superposition, Extreme ultraviolet, Ion beams

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Proceedings Article | 5 October 2005 Paper

X-UV chirped mirror fabrication for phase control of attosecond pulses

Anne-Sophie Morlens, Philippe Zeitoun, Arnaud Jérome, Marc Roulliay, Vincent Laude, Françoise Bridou, Sophie Kazamias, Marie-Françoise Ravet, Rodrigo López-Martens, Franck Delmotte, Philippe Balcou

Proceedings Volume 5963, 59630W (2005) https://doi.org/10.1117/12.625097

KEYWORDS: Mirrors, Reflectivity, Silicon, Molybdenum, Multilayers, Extreme ultraviolet, Calibration, Reflectometry, Neon, Control systems

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Proceedings Article | 5 October 2005 Paper

Performances and stability of Sc/Si multilayers with barrier layers for wavelengths around 46 nm

Franck Delmotte, Arnaud Jerome, Angelo Giglia, Marie-Francoise Ravet, Francoise Bridou, Julien Gautier, Stefano Nannarone, Marc Roulliay

Proceedings Volume 5963, 59630X (2005) https://doi.org/10.1117/12.625030

KEYWORDS: Reflectivity, Annealing, Multilayers, Reflectometry, Silicon, Sputter deposition, Argon, X-rays, Extreme ultraviolet, Scandium

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Proceedings Article | 25 February 2004 Paper

Ion-beam-deposited Mo/Si multilayers for EUV imaging applications in astrophysics

Marie-Francoise Ravet, Francoise Bridou, Franck Delmotte, Jean-Pierre Delaboudiniere, Marie Bougnet, Xueyan Zhang-Song, Raymond Mercier, Philippe Bouyries, Arnaud Jerome

Proceedings Volume 5250, (2004) https://doi.org/10.1117/12.514597

KEYWORDS: Reflectivity, Multilayers, Telescopes, Mirrors, Calibration, Extreme ultraviolet, Reflectometry, Ion beams, Silicon, Reflector telescopes

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Proceedings Article | 18 February 2004 Paper

MAGRITTE optomechanical design and mirror manufacturing

Mourad Idir, Laurence Rossi, Emmanuel Mazy, Jean-Philippe Halain, Pierre Rochus, Raymond Mercier, Marie-Francoise Ravet, Jean-Marc Defise, Franck Delmotte

Proceedings Volume 5249, (2004) https://doi.org/10.1117/12.513998

KEYWORDS: Mirrors, Extreme ultraviolet, Telescopes, Optical benches, Coating, Space telescopes, Space operations, Optical filters, Multilayers, Solar processes

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Proceedings Article | 4 February 2004 Paper

EUVI: the STEREO-SECCHI extreme ultraviolet imager

Volker Bothmer, Jeffrey Newmark, Joseph Cannon, Marie-Francoise Ravet, Jean-Pierre Wuelser, Werner Deutsch, Raymond Mercier, Francoise Bridou, Franck Delmotte, Marie Bougnet, Augustus Moore, C. Wolfson, Michel Mullot, Frederic Auchere, Gerard Colas, J. Pearson, Xueyan Song, John Moses, Brock Carpenter, Jean-Yves Clotaire, Larry Springer, Theodore Tarbell, Jean-Pierre Delaboudiniere, Michel Lamare, Rosemarie Navarro, George Rossi, Guy Artzner, Syndie Meyer, James Lemen, Dexter Duncan, Glenn Gradwohl, Philippe Bouyries, Russell Howard, Arnaud Jerome

Proceedings Volume 5171, (2004) https://doi.org/10.1117/12.506877

KEYWORDS: Mirrors, Telescopes, Space telescopes, Extreme ultraviolet, Charge-coupled devices, Optical filters, Calibration, Coating, Observatories, Sensors

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Proceedings Article | 19 December 2003 Paper

Coherence measurements of a transient 14.7-nm x-ray laser

Christian Remond, Philippe Zeitoun, Joseph Nilsen, Ciaran Lewis, Sylvie Jacquemot, James Hunter, Marta Fajardo, Marie-Francoise Ravet, Sebastian Hubert, Vyacheslav Shlyaptsev, Raymond Smith, James Dunn, Remy Marmoret, Franck Delmotte, Laurent Vanbostal

Proceedings Volume 5197, (2003) https://doi.org/10.1117/12.504929

KEYWORDS: X-ray lasers, Picosecond phenomena, Visibility, Interferometers, Ions, Palladium, Plasma, Beam splitters, Michelson interferometers, Mirrors

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Proceedings Article | 19 December 2003 Paper

New techniques for the measurement of x-ray beam or x-ray optics quality

Constance Valentin, Kenneth Goldberg, Stephane Sebban, G. Faivre, Patrick Naulleau, Philippe Zeitoun, Mourad Idir, A. Morlens, Laurent Vanbostal, Jim Hunter, Philippe Balcou, Philippe Troussel, Xavier Levecq, Pascal Mercere, Jorge Rocca, Samuel Bucourt, James Dunn, Denis Douillet, Remy Marmoret, Sebastien le Pape, Ciaran Lewis, Sylvie Jacquemot, Sophie Kazamias, Marie-Francoise Ravet, Raymond Smith, Sebastien Hubert, Djamel Benredjem, Marta Fajardo, Christian Remond, Franck Delmotte, Guillaume Dovillaire

Proceedings Volume 5197, (2003) https://doi.org/10.1117/12.508183

KEYWORDS: Wavefronts, X-ray lasers, Wavefront sensors, Extreme ultraviolet, Plasma, Mirrors, Interferometers, Picosecond phenomena, Michelson interferometers, X-ray optics

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Showing 5 of 36 publications

Conference Committee Involvement (4)

Advances in Optical Thin Films VIII

8 April 2024 | Strasbourg, France

Advances in Optical Thin Films VII

13 September 2021 | Online Only, Spain

Advances in Optical Thin Films VI

14 May 2018 | Frankfurt, Germany

Advances in Optical Thin Films IV

5 September 2011 | Marseille, France

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