In the realm of next-generation EUV masks, several material candidates show promising absorber behaviors, ranging from binary to phase-shift types. However, the mask repair process presents challenges when managing wafer windows for repaired defects. Precious profile control, high repair-defect durability and clean reticle surface need to be sustained to ensure lithography processes window. In this paper, several materials’ opaque defect etching is evaluated by using ZEISS e-beam based MeRiT® neXT repair tools, which offer an optimal physico-chemical process with right precursor chemistry and an optimized scanning of the e-beam over the surface to ensure repair quality. Moreover, longer repair time for next generation masks also challenges post-repair clean yield due to poor wettability from etching byproduct redeposition on reticle surface. Thus, we control a plasma flushing vacuum chamber application to eliminate surface wettability degradation, ensuring high post-repair clean yield. Our comprehensive strategy not only addresses current challenges with better reticle quality and longer lifetime but also paves the way for the seamless integration of advanced EUV mask materials into the future of semiconductor lithography.
The paradigm switch to a reflective mask design for EUV lithography has proven to be challenging. Within the Horizon2020 PIn3S program Zeiss and imec are collaborating to address some of these challenges. In this work, an EUV mask with a collection of programmed defects representative for the 3nm technology node was reviewed. Defect printability at wafer level was analyzed after exposure on the ASML NXE:3400B by SEM. Furthermore, the mask was analyzed on the Zeiss AIMS® EUV platform and by SEM. For P36 (1x) 1:1 L/S programmed extrusions we have demonstrated that AIMS® EUV can be used to predict ADI local defect widths as well as (μ)bridge printability. Moreover, from P36 to P32 the mask spec regarding allowed opaque L/S extrusion widths needs to be tighter considering an earlier onset of ADI (μ)bridge printability and a stronger than expected ADI defect width increase through pitch.
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