Dr. Gerson Mette
at Carl Zeiss SMT GmbH
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 12 November 2024 Presentation + Paper
C. Chen, P. Weng, C. Chiang, P. Chen, Vincent C. Wen, Gerson Mette, Christian Felix Hermanns, Thorsten Hofmann, Klaus Edinger, Y. Li
Proceedings Volume 13216, 132160Q (2024) https://doi.org/10.1117/12.3034694
KEYWORDS: Etching, Photomasks, Extreme ultraviolet, Electron beams, Mask cleaning

Proceedings Article | 5 October 2023 Paper
Yannick Hermans, Tilmann Heil, Renzo Capelli, Bartholomaeus Szafranek, Daniel Rhinow, Gerson Mette, Patrick Salg, Christian Felix Hermanns, Bappaditya Dey, Luc Halipre, Darko Trivkovic, Paulina Rincon Delgadillo, Thomas Marschner, Sandip Halder
Proceedings Volume 12802, 128020H (2023) https://doi.org/10.1117/12.2678392
KEYWORDS: Extrusion, Extreme ultraviolet, Semiconducting wafers, Critical dimension metrology, Scanning electron microscopy, Extreme ultraviolet lithography, Lithography, Defect inspection

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