Dr. Guowei Zhao
at Lumentum
SPIE Involvement:
Author
Publications (7)

Proceedings Article | 13 March 2024 Presentation + Paper
Hemashilpa Kalagara, Ben Kesler, Eric Hegblom, Preethi Dacha, Matthew Peters, Guowei Zhao, Jun Yang, Daniel Shi, Kevin Yu
Proceedings Volume 12904, 129040G (2024) https://doi.org/10.1117/12.3015301
KEYWORDS: Vertical cavity surface emitting lasers, LIDAR, Anodes, Detector arrays, Temperature metrology, Design, Lens arrays, Sensors, Semiconducting wafers, Resistance

Proceedings Article | 15 March 2023 Presentation + Paper
Hemashilpa Kalagara, Eric Hegblom, Ben Kesler, Matthew Peters, Guowei Zhao, Jun Yang, Mike Dolganov, Daniel Shi, Kevin Yu
Proceedings Volume 12439, 124390A (2023) https://doi.org/10.1117/12.2668729
KEYWORDS: Vertical cavity surface emitting lasers, LIDAR, Autonomous driving

Proceedings Article | 28 March 2022 Presentation + Paper
Hemashilpa Kalagara, Guowei Zhao, Jun Yang, Benjamin Kesler, Mohammad Ali Shirazi, Mahdad Mansouree, Qianhuan Yu, Matthew Peters
Proceedings Volume 12020, 1202002 (2022) https://doi.org/10.1117/12.2614461
KEYWORDS: Vertical cavity surface emitting lasers, LIDAR, Three dimensional sensing, Temperature metrology, Sensing systems, Oxidation, Near field optics, Near field, Internet, Consumer electronics

Proceedings Article | 5 March 2021 Presentation
Guowei Zhao, Jun Yang, Eric Hegblom, Ajit Barve, Benjamin Kesler, Mark Tashima, Zhixi Bian, Suning Xie, Abhinav Robit, Matthew Peters, Jay Skidmore
Proceedings Volume 11704, 117040A (2021) https://doi.org/10.1117/12.2577338
KEYWORDS: Vertical cavity surface emitting lasers, Reliability, Three dimensional sensing, Mobile devices, Measurement devices, LIDAR, Resistance, Laser applications, Inductance, Facial recognition systems

Proceedings Article | 4 March 2015 Paper
Xu Yang, Mingxin Li, Guowei Zhao, Yu Zhang, Sabine Freisem, Dennis Deppe
Proceedings Volume 9381, 93810R (2015) https://doi.org/10.1117/12.2079920
KEYWORDS: Vertical cavity surface emitting lasers, Lithography, Oxides, Reliability, Quantum efficiency, Resistance, Temperature metrology, Optical sensing, Continuous wave operation

Showing 5 of 7 publications
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