Dr. Haidar de Fornel Profile

Dr. Haidar de Fornel

SPIE Involvement:

Author

Publications (1)

Proceedings Article | 17 August 2004 Paper

Study of the roughness and optical near field of mass surface by using a SNOM with shear-force regulation

Youssef Haidar, Frederique de Fornel, Chouki Zerouki, Patrick Pinot

Proceedings Volume 5458, (2004) https://doi.org/10.1117/12.545692

KEYWORDS: Near field optics, Near field scanning optical microscopy, Near field, Surface roughness, Spatial frequencies, Surface finishing, Scattering, Polarization, Prototyping, Iridium

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years