Dr. Hans Kruger Profile

Dr. Hans Kruger

at Univ Bonn

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Author

Publications (5)

Proceedings Article | 20 February 2017 Paper

AGIPD: a multi megapixel, multi megahertz X-ray camera for the European XFEL

Ulrich Trunk, A. Allahgholi, J. Becker, A. Delfs, R. Dinapoli, P. Göttlicher, H. Graafsma, D. Greiffenberg, H. Hirsemann, S. Jack, A. Klyuev, H. Krueger, S. Lange, T. Laurus, A. Marras, D. Mezza, A. Mozzanica, J. Poehlsen, S. Rah, B. Schmitt, J. Schwandt, I. Sheviakov, X. Shi, Q. Xia, J. Zhang, M. Zimmer

Proceedings Volume 10328, 1032805 (2017) https://doi.org/10.1117/12.2269153

KEYWORDS: Sensors, Photons, Single photon, X-rays, Image storage, Amplifiers, Free electron lasers, Diffraction, Cameras, Multiplexers

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Proceedings Article | 3 May 2013 Paper

The AGIPD System for the European XFEL

Laura Bianco, J. Becker, R.D. Dinapoli, E. Fretwurst, P. Goettlicher, H. Graafsma, D. Greiffenberg, M. Gronewald, B. Henrich, H. Hirsemann, S. Jack, R. Klanner, A. Klyuev, H. Krueger, A. Marras, A. Mozzanica, S. Rah, B. Schmitt, X. Shi, U. Trunk, J. Schwandt, J. Zhang

Proceedings Volume 8778, 87780V (2013) https://doi.org/10.1117/12.2017360

KEYWORDS: Sensors, X-rays, Calibration, Image storage, Photons, Single photon, Amplifiers, Silicon, Gain switching, Analog electronics

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Proceedings Article | 18 March 2008 Paper

CIX: a detector for spectrally enhanced x-ray imaging by simultaneous counting and integrating

H. Krüger, J. Fink, E. Kraft, N. Wermes, P. Fischer, I. Peric, C. Herrmann, M. Overdick, W. Rütten

Proceedings Volume 6913, 69130P (2008) https://doi.org/10.1117/12.771706

KEYWORDS: Sensors, Photon counting, X-rays, Crystals, Signal to noise ratio, Signal processing, X-ray imaging, Interference (communication), X-ray detectors, Clocks

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Proceedings Article | 18 August 2005 Paper

Noise and spectroscopic performance of DEPMOSFET matrix devices for XEUS

J. Treis, P. Fischer, O. Hälker, S. Herrmann, R. Kohrs, H. Krüger, P. Lechner, G. Lutz, I. Peric, M. Porro, R. Richter, L. Strüder, M. Trimpl, N. Wermes, S. Wölfel

Proceedings Volume 5898, 58980X (2005) https://doi.org/10.1117/12.614894

KEYWORDS: Sensors, Spectroscopes, Field effect transistors, Transistors, Temperature metrology, Prototyping, Spectral resolution, Imaging spectroscopy, Signal processing, Electronics

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Proceedings Article | 29 September 2004 Paper

First results of DEPFET-based active-pixel-sensor prototypes for the XEUS wide-field imager

Johannes Treis, Peter Fischer, Olaf Halker, Matthias Harter, Sven Herrmann, Robert Kohrs, Hans Krueger, Peter Lechner, Gerhard Lutz, Ivan Peric, Matteo Porro, Rainer Richter, Lothar Strueder, Marcel Trimpl, Norbert Wermes

Proceedings Volume 5501, (2004) https://doi.org/10.1117/12.551536

KEYWORDS: Field effect transistors, Sensors, Prototyping, Transistors, Signal processing, Analog electronics, Electrons, Cadmium sulfide, Field programmable gate arrays, Imaging systems

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