Prof. Heinz Hügli
Honorary professor at Univ of Neuchâtel
SPIE Involvement:
Author
Publications (23)

Proceedings Article | 29 August 2008 Paper
Proceedings Volume 7066, 70660K (2008) https://doi.org/10.1117/12.793629
KEYWORDS: Clouds, Cameras, Microscopes, Imaging systems, Safety, Inspection, Time of flight cameras, 3D image processing, Sensors, Range imaging

Proceedings Article | 25 April 2008 Paper
Proceedings Volume 7000, 700008 (2008) https://doi.org/10.1117/12.781015
KEYWORDS: Inspection, Metals, Defect detection, Lenses, Image processing, Microlens array, Databases, Image segmentation, Microlens, Coating

Proceedings Article | 4 March 2008 Paper
A. Bur, P. Wurtz, R. Müri, H. Hügli
Proceedings Volume 6806, 68060O (2008) https://doi.org/10.1117/12.764556
KEYWORDS: Motion models, Cameras, Visualization, Video, Computer simulations, Eye models, Visual process modeling, Performance modeling, Eye, RGB color model

Proceedings Article | 10 October 2007 Paper
Proceedings Volume 6762, 67620H (2007) https://doi.org/10.1117/12.733961
KEYWORDS: Scattering, Scattering compensation, Image filtering, Point spread functions, Cameras, Electronic filtering, Deconvolution, Time of flight cameras, Light scattering, Image processing

Proceedings Article | 16 February 2007 Paper
A. Bur, P. Wurtz, R. M. Müri, H. Hügli
Proceedings Volume 6492, 649219 (2007) https://doi.org/10.1117/12.704185
KEYWORDS: Motion models, Eye models, Visualization, Visual process modeling, Performance modeling, Video, RGB color model, Eye, Human subjects, Computer simulations

Showing 5 of 23 publications
Proceedings Volume Editor (1)

Conference Committee Involvement (8)
Optical Inspection and Metrology for Non-Optics Industries
3 August 2009 | San Diego, California, United States
Two- and Three-Dimensional Methods for Inspection and Metrology VI
10 August 2008 | San Diego, California, United States
Two- and Three-Dimensional Methods for Inspection and Metrology V
12 September 2007 | Boston, MA, United States
Two- and Three-Dimensional Methods for Inspection and Metrology IV
1 October 2006 | Boston, Massachusetts, United States
Two- and Three-Dimensional Methods for Inspection and Metrology III
25 October 2005 | Boston, MA, United States
Showing 5 of 8 Conference Committees
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top