Hsiang Jen Yang
at Taiwan Mask Corp.
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 22 November 2023 Poster
Proceedings Volume PC12751, PC127510X (2023) https://doi.org/10.1117/12.2687188
KEYWORDS: Critical dimension metrology, Beam path, Error control coding, Photoresist materials, Integration, Etching, Design and modelling

Proceedings Article | 29 September 2023 Paper
Proceedings Volume 12915, 129150O (2023) https://doi.org/10.1117/12.2685008
KEYWORDS: Transmission electron microscopy, Photomasks, 3D modeling, Metrology, 3D metrology, Scanning electron microscopy, 3D image processing, Industry, 3D mask effects, Semiconducting wafers

Proceedings Article | 16 September 2022 Paper
Hsiang Jen Yang, Po Sheng Wang, Chun Chieh Han, Yi Min Lin, Wen Wei Lee, Wei Shen Chen
Proceedings Volume 12325, 123250T (2022) https://doi.org/10.1117/12.2640527
KEYWORDS: Photomasks, Raster graphics, Reticles

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