Dr. Hui Yang Profile

Dr. Hui Yang

CTO at Arden Photonics Ltd

SPIE Involvement:

Author

Publications (4)

Proceedings Article | 17 May 2018 Presentation + Paper

Traceable instruments for encircled angular flux measurements

Natascia Castagna, Jacques Morel, Edward Robinson, Hui Yang

Proceedings Volume 10683, 106831B (2018) https://doi.org/10.1117/12.2306430

KEYWORDS: Cameras, CMOS cameras, Calibration, CCD cameras, Metrology, Gradient-index optics, Light sources, Multimode fibers, Step index fibers

Read Abstract +

Proceedings Article | 3 April 2015 Paper

Equilibrium modal power distribution measurement of step-index hard plastic cladding and graded-index silica multimode fibers

Ruichen Tao, Takehiro Hayashi, Manabu Kagami, Shigeru Kobayashi, Manabu Yasukawa, Hui Yang, David Robinson, Hadi Baghsiahi, F. Aníbal Fernández, David Selviah

Proceedings Volume 9368, 93680N (2015) https://doi.org/10.1117/12.2079355

KEYWORDS: Optical fibers, Charge-coupled devices, Light emitting diodes, CCD cameras, Multimode fibers, Free space, Silica, Cladding, Near field, Solids

Read Abstract +

Proceedings Article | 14 February 2007 Paper

Improvement and commissioning of a novel technology for the measurement of laser-beam profiles

Simon Hall, David Robinson, Steven Knox, Hui Yang, Andrew Scott, Simon Woods, Andrew Turner, Andrew Lewin

Proceedings Volume 6452, 645208 (2007) https://doi.org/10.1117/12.699073

KEYWORDS: Sensors, Diffraction gratings, Laser beam propagation, Standards development, Vertical cavity surface emitting lasers, Optical testing, Beam propagation method, Laser applications, Cameras, CCD image sensors

Read Abstract +

Proceedings Article | 10 November 2003 Paper

Holographic particle image velocimetry: a comparison of digital shearing and 3D correlation analysis methods

Hui Yang, Rob Alcock, Neil Halliwell, Jeremy Coupland

Proceedings Volume 5191, (2003) https://doi.org/10.1117/12.510214

KEYWORDS: Digital holography, 3D image processing, Holograms, Holography, Particle image velocimetry, Particles, 3D metrology, Optical diagnostics, Solids, Combustion

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years