Junsu Jeon
at SAMSUNG Electronics Co Ltd
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 4 April 2019 Presentation + Paper
Proceedings Volume 10962, 1096204 (2019) https://doi.org/10.1117/12.2514896
KEYWORDS: Computer aided design, Metals, Resolution enhancement technologies, Optical lithography, CMOS technology, Extreme ultraviolet, Extreme ultraviolet lithography, Lithography, Double patterning technology, Manufacturing

Proceedings Article | 15 March 2012 Paper
Daehyun Jang, Naya Ha, Junsu Jeon, Jae-Hyun Kang, Seung Weon Paek, Hungbok Choi, Kee Sup Kim, Ya-Chieh Lai, Philippe Hurat, Wilbur Luo
Proceedings Volume 8327, 83270S (2012) https://doi.org/10.1117/12.916199
KEYWORDS: Silicon, Manufacturing, Lithography, Failure analysis, Data processing, Chemical mechanical planarization, Semiconducting wafers, Design for manufacturability, Tolerancing, Optical lithography

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