Mr. Jim Daly Profile

Jim Daly

Sr. Scientist at Bodkin Design & Engineering LLC

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Author

Publications (17)

Proceedings Article | 3 June 2015 Paper

High spatial resolution LWIR hyperspectral sensor

Carson Roberts, Andrew Bodkin, James Daly, Joseph Meola

Proceedings Volume 9482, 94820U (2015) https://doi.org/10.1117/12.2178148

KEYWORDS: Staring arrays, Imaging systems, Hyperspectral imaging, Calibration, Black bodies, Long wavelength infrared, Image processing, Signal to noise ratio, Sensors, Spatial resolution

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Proceedings Article | 4 June 2013 Paper

Precision radiometric surface temperature (PRST) sensor

James Daly, Carson Roberts, Andrew Bodkin, Robert Sundberg, Scott Beaven, Jeffrey Weinheimer

Proceedings Volume 8707, 87070A (2013) https://doi.org/10.1117/12.2016092

KEYWORDS: Temperature metrology, Sensors, Imaging systems, Hyperspectral imaging, Mid-IR, Databases, Cameras, Aluminum, Black bodies, Pyrometry

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Proceedings Article | 18 May 2012 Paper

Video-rate chemical identification and visualization with snapshot hyperspectral imaging

Andrew Bodkin, A. Sheinis, A. Norton, J. Daly, C. Roberts, S. Beaven, J. Weinheimer

Proceedings Volume 8374, 83740C (2012) https://doi.org/10.1117/12.919202

KEYWORDS: Imaging systems, Hyperspectral imaging, Video, Mid-IR, Long wavelength infrared, Black bodies, Staring arrays, Spatial resolution, Calibration, Visible radiation

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Proceedings Article | 27 April 2009 Paper

Snapshot hyperspectral imaging: the hyperpixel array camera

Andrew Bodkin, A. Sheinis, A. Norton, J. Daly, S. Beaven, J. Weinheimer

Proceedings Volume 7334, 73340H (2009) https://doi.org/10.1117/12.818929

KEYWORDS: Imaging systems, Long wavelength infrared, Mid-IR, Staring arrays, Hyperspectral imaging, Black bodies, Nonuniformity corrections, Visible radiation, Prisms, Calibration

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Proceedings Article | 14 May 2007 Paper

Narrowband infrared emitters for combat ID

Martin Pralle, Irina Puscasu, James Daly, Keith Fallon, Peter Loges, Anton Greenwald, Edward Johnson

Proceedings Volume 6542, 65422Z (2007) https://doi.org/10.1117/12.719794

KEYWORDS: Infrared radiation, Cameras, Long wavelength infrared, Light sources, Photonic crystals, Microelectromechanical systems, Photonics, Silicon, Infrared technology, Mid-IR

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Proceedings Article | 9 November 2005 Paper

CW simulant detection by NDIR

Jim Daly, Mark McNeal, Bill Gully, Frank Swanson

Proceedings Volume 5994, 59940L (2005) https://doi.org/10.1117/12.630888

KEYWORDS: Sensors, Absorption, Nerve agents, Absorbance, Infrared sensors, Infrared radiation, Blistering agents, Sulfur, Thermography

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Proceedings Article | 8 October 2004 Paper

Photonic crystals enable infrared gas sensors

Irina Puscasu, Edward Johnson, Martin Pralle, Mark McNeal, James Daly, Anton Greenwald

Proceedings Volume 5515, (2004) https://doi.org/10.1117/12.559644

KEYWORDS: Photonic crystals, Infrared sensors, Sensors, Infrared radiation, Gas sensors, Absorption, Gases, Metals, Carbon monoxide, Environmental sensing

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Proceedings Article | 5 September 2002 Paper

Development of optical MEMS CO2 sensors

Mark McNeal, Nicholas Moelders, Martin Pralle, Irina Puscasu, Lisa Last, William Ho, Anton Greenwald, James Daly, Edward Johnson, Thomas George

Proceedings Volume 4815, (2002) https://doi.org/10.1117/12.482316

KEYWORDS: Sensors, Carbon dioxide, Infrared radiation, Gas sensors, Microelectromechanical systems, Absorption, Infrared spectroscopy, Thermography, Infrared detectors, Resistance

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Proceedings Article | 22 February 2002 Paper

MEMS-based sensor system for environmental monitoring

James Daly, Edward Johnson, Nicholas Moelders, Mark McNeal, Martin Pralle, Anton Greenwald, William Ho, Irina Puscasu, Thomas George, Daniel Choi

Proceedings Volume 4576, (2002) https://doi.org/10.1117/12.456941

KEYWORDS: Sensors, Microelectromechanical systems, Carbon monoxide, Absorption, Infrared spectroscopy, Infrared radiation, Infrared sensors, Ions, Signal detection, Gases

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Proceedings Article | 7 February 2002 Paper

Photonic crystals for narrow-band infrared emission

Martin Pralle, Mark McNeal, Nicholas Moelders, Lisa Last, William Ho, Anton Greenwald, James Daly, Irina Puscasu, Edward Johnson, Ihab El-Kady, Rana Biswas

Proceedings Volume 4574, (2002) https://doi.org/10.1117/12.455159

KEYWORDS: Silicon, Reflectivity, Infrared radiation, Metals, Absorption, Microelectromechanical systems, Sensors, Surface plasmons, Infrared spectroscopy, Carbon monoxide

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Proceedings Article | 2 October 2001 Paper

Development of optical MEMS carbon dioxide sensors

Nicholas Moelders, Mark McNeal, Martin Pralle, Lisa Last, William Ho, Anton Greenwald, James Daly, Edward Johnson, Thomas George, Daniel Choi

Proceedings Volume 4561, (2001) https://doi.org/10.1117/12.443100

KEYWORDS: Sensors, Microelectromechanical systems, Silicon, Carbon monoxide, Infrared radiation, Thermography, Thermal modeling, Gas sensors, Etching, Instrument modeling

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Proceedings Article | 15 August 2000 Paper

MEMS device for mass market gas and chemical sensors

Brian Kinkade, James Daly, Edward Johnson

Proceedings Volume 4176, (2000) https://doi.org/10.1117/12.395626

KEYWORDS: Sensors, Gas sensors, Infrared radiation, Infrared sensors, Carbon monoxide, Microelectromechanical systems, Gases, Infrared detectors, Ions, Infrared spectroscopy

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Gas and chemical sensors are used in many applications. Industrial health and safety monitors allow companies to meet OSHA requirements by detecting harmful levels of toxic or combustible gases. Vehicle emissions are tested during annual inspections. Blood alcohol breathalizers are used by law enforcement. Refrigerant leak detection ensures that the Earth's ozone layer is not being compromised. Industrial combustion emissions are also monitored to minimize pollution. Heating and ventilation systems watch for high levels of carbon dioxide (CO2) to trigger an increase in fresh air exchange. Carbon monoxide detectors are used in homes to prevent poisoning from poor combustion ventilation. Anesthesia gases are monitored during a patients operation. The current economic reality is that two groups of gas sensor technologies are competing in two distinct existing market segments - affordable (less reliable) chemical reaction sensors for consumer markets and reliable (expensive) infrared (IR) spectroscopic sensors for industrial, laboratory, and medical instrumentation markets. Presently high volume mass-market applications are limited to CO detectros and on-board automotive emissions sensors. Due to reliability problems with electrochemical sensor-based CO detectors there is a hesitancy to apply these sensors in other high volume applications. Applications such as: natural gas leak detection, non-invasive blood glucose monitoring, home indoor air quality, personal/portable air quality monitors, home fire/burnt cooking detector, and home food spoilage detectors need a sensor that is a small, efficient, accurate, sensitive, reliable, and inexpensive. Connecting an array of these next generation gas sensors to wireless networks that are starting to proliferate today creates many other applications. Asthmatics could preview the air quality of their destinations as they venture out into the day. HVAC systems could determine if fresh air intake was actually better than the air in the house. Internet grocery delivery services could check for spoiled foods in their clients' refrigerators. City emissions regulators could monitor the various emissions sources throughout the area from their desk to predict how many pollution vouchers they will need to trade in the next week. We describe a new component architecture for mass-market sensors based on silicon microelectromechanical systems (MEMS) technology. MEMS are micrometer-scale devices that can be fabricated as discrete devices or large arrays, using the technology of integrated circuit manufacturing. These new photonic bandgap and MEMS fabricataion technologies will simplify the component technology to provide high-quality gas and chemical sensors at consumer prices.

Proceedings Article | 17 April 2000 Paper

Multispectral reflectance-mode fiber optic deposition rate monitor

James Daly, John Wollam, Fei Luo, Theodore Morse, Andreas Kussmaul, Dan Pulver

Proceedings Volume 3938, (2000) https://doi.org/10.1117/12.382831

KEYWORDS: Reflectivity, Semiconductor lasers, Reflection, Coating, Thin films, Refraction, Silicon, Fiber optics, Light sources, Quartz

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Proceedings Article | 17 April 2000 Paper

Nanostructured surfaces for tuned infrared emission for spectroscopic applications

James Daly, Anton Greenwald, Edward Johnson, William Stevenson, John Wollam, Thomas George, Eric Jones

Proceedings Volume 3937, (2000) https://doi.org/10.1117/12.382797

KEYWORDS: Infrared radiation, Semiconducting wafers, Reflectivity, Carbon monoxide, Infrared spectroscopy, Etching, Metals, Spectroscopy, Ions, Absorption

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Proceedings Article | 13 April 2000 Paper

Tunable narrow-band filter for LWIR hyperspectral imaging

James Daly, W. Andrew Bodkin, William Schneller, Robert Kerr, John Noto, Raymond Haren, Michael Eismann, Barry Karch

Proceedings Volume 3948, (2000) https://doi.org/10.1117/12.382145

KEYWORDS: Liquid crystals, Fabry–Perot interferometers, Mirrors, Optical filters, Cameras, Image filtering, Infrared imaging, Imaging systems, Tunable filters, Long wavelength infrared

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Proceedings Article | 15 March 2000 Paper

Recent advances in miniaturization of infrared spectrometers

James Daly, Edward Johnson, W. Andrew Bodkin, William Stevenson, David White

Proceedings Volume 3953, (2000) https://doi.org/10.1117/12.379616

KEYWORDS: Spectrometers, Infrared radiation, Sensors, Waveguides, Spectrographs, Silicon, Detector arrays, Infrared detectors, Thermography, Infrared spectroscopy

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Proceedings Article | 13 July 1994 Paper

Production of low-cost large-area CdZnTe films by metalorganic chemical vapor deposition (MOCVD) on GaAs and Si substrates

Nasser Karam, F. Smith, Rengarajan Sudharsanan, A. Mastrovito, James Daly, Michael Sanfacon, M. Leonard, N. El-Masry

Proceedings Volume 2228, (1994) https://doi.org/10.1117/12.179651

KEYWORDS: Metalorganic chemical vapor deposition, Gallium arsenide, Silicon, Liquid phase epitaxy, Mercury cadmium telluride, Semiconducting wafers, Contamination, Tellurium, Zinc, Interfaces

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Showing 5 of 17 publications

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