Mr. James A. DiBella Profile

James A. DiBella

System Applications Engineering Manager at ON Semiconductor

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Publications (5)

Proceedings Article | 19 February 2013 Paper

High performance 7.4-micron interline transfer CCD platform for applied imaging markets

Douglas Carpenter, James DiBella, Robert Kaser, Brent Kecskemety, Stephen Kosman, John McCarten, Christopher Parks

Proceedings Volume 8659, 865908 (2013) https://doi.org/10.1117/12.982017

KEYWORDS: Charge-coupled devices, Quantum efficiency, Cameras, Photodiodes, Amplifiers, Ferroelectric LCDs, Diffusion, Image sensors, Interference (communication), Capacitance

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Proceedings Article | 15 February 2012 Paper

Accurate color with increased sensitivity using IR

Amy Enge, James DiBella

Proceedings Volume 8298, 82980R (2012) https://doi.org/10.1117/12.911281

KEYWORDS: Infrared imaging, Optical filters, Image filtering, Image processing, Imaging systems, Cameras, Quantum efficiency, Image sensors, Visible radiation, Vegetation

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Proceedings Article | 15 February 2012 Paper

29-mp 35-mm format interline CCD image sensor

Eric Meisenzahl, Douglas Carpenter, James DiBella, James Doran, Robert Fabinski, Stephen Kosman, John McCarten

Proceedings Volume 8298, 82980L (2012) https://doi.org/10.1117/12.909635

KEYWORDS: Photodiodes, CCD image sensors, Ferroelectric LCDs, Charge-coupled devices, Quantum efficiency, Image resolution, Cameras, Sensors, Silicon, Microlens

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Proceedings Article | 26 January 2010 Paper

Improved sensitivity high-definition interline CCD using the KODAK TRUESENSE color filter pattern

James DiBella, Marco Andreghetti, Amy Enge, William Chen, Timothy Stanka, Robert Kaser

Proceedings Volume 7536, 753603 (2010) https://doi.org/10.1117/12.845624

KEYWORDS: Optical filters, Image processing, Sensors, Image sensors, Charge-coupled devices, Imaging systems, Quantum efficiency, Cameras, Intelligence systems, RGB color model

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Proceedings Article | 28 January 2009 Paper

New 5.5 µm interline transfer CCD platform for applied imaging markets

Douglas Carpenter, James DiBella, Robert Kaser, Stephen Kosman, Xueyuan Liu, John McCarten, Eric Meisenzahl, David Nichols, Christopher Parks, Thomas Pian

Proceedings Volume 7249, 72490C (2009) https://doi.org/10.1117/12.806389

KEYWORDS: Charge-coupled devices, CCD image sensors, Image sensors, Quantum efficiency, Sensors, Cameras, Electrons, Photodiodes, Imaging systems, Product engineering

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Conference Committee Involvement (4)

Image Sensors and Imaging Systems 2015

9 February 2015 | San Francisco, California, United States

Image Sensors and Imaging Systems 2014

5 February 2014 | San Francisco, California, United States

Sensors, Cameras, and Systems for Industrial/Scientific Applications XIV

6 February 2013 | Burlingame, California, United States

Sensors, Cameras, and Systems for Industrial/Scientific Applications XIII

25 January 2012 | Burlingame, California, United States

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