Jarret Peskar
at Univ of South Carolina
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 9 May 2024 Presentation + Paper
Proceedings Volume 12951, 129510Q (2024) https://doi.org/10.1117/12.3011097
KEYWORDS: Batteries, Safety, Digital image correlation, Failure analysis, Amplifiers, Deformation, Temperature metrology, Reliability, Nondestructive evaluation, Nickel

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