Dr. Jeffrey W. Keister Profile

Dr. Jeffrey W. Keister

at Brookhaven National Lab

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Author

Publications (4)

Proceedings Article | 5 September 2014 Paper

Simulation of the ultrahigh energy resolution IXS analyzer system at NSLS-II

Alexey Suvorov, David Coburn, Alessandro Cunsolo, Jeffrey Keister, Yong Cai

Proceedings Volume 9209, 92090Y (2014) https://doi.org/10.1117/12.2061844

KEYWORDS: Mirrors, X-rays, Crystals, Spectroscopy, X-ray optics, Synchrotrons, Backscatter, Multilayers, Neodymium, Statistical analysis

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Proceedings Article | 23 September 2011 Paper

Dynamical modeling of high-energy-resolution x-ray optics

Yuri Stetsko, Jeffrey Keister, Alexey Suvorov, D. Scott Coburn, Chaminda Kodituwakku, Alessandro Cunsolo, Yong Cai

Proceedings Volume 8141, 81410R (2011) https://doi.org/10.1117/12.892820

KEYWORDS: Crystals, X-ray optics, Monochromators, X-rays, Diffraction, Backscatter, Reflection, X-ray diffraction, Reflectivity, Computer simulations

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Proceedings Article | 4 September 2009 Paper

Development of a silicon drift detector array: an x-ray fluorescence spectrometer for remote surface mapping

Jessica Gaskin, Gabriella Carini, Wei Chen, Gianluigi De Geronimo, Ronald Elsner, Jeffrey Keister, Georgiana Kramer, Zheng Li, Brian Ramsey, Pavel Rehak, D. Peter Siddons

Proceedings Volume 7441, 744118 (2009) https://doi.org/10.1117/12.826389

KEYWORDS: Sensors, Silicon, Spectroscopy, X-rays, Electronics, Detector development, Detector arrays, X-ray detectors, Electrodes, Prototyping

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Proceedings Article | 20 September 2007 Paper

Silicon photodiodes for absolute soft x-ray radiometry

Jeffrey Keister

Proceedings Volume 6689, 66890U (2007) https://doi.org/10.1117/12.741601

KEYWORDS: Diodes, Silicon, X-rays, Calibration, Photodiodes, Silicon carbide, Sensors, Oxides, Resistance, Data modeling

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