John Steven Anderson
SPIE Involvement:
Author
Publications (13)

Proceedings Article | 17 May 2006 Paper
D. Murphy, M. Ray, A. Kennedy, J. Wyles, C. Hewitt, R. Wyles, E. Gordon, T. Sessler, S. Baur, D. Van Lue, S. Anderson, R. Chin, H. Gonzalez, C. Le Pere, S. Ton
Proceedings Volume 6206, 62061A (2006) https://doi.org/10.1117/12.674018
KEYWORDS: Staring arrays, Sensors, Microbolometers, Electronics, Readout integrated circuits, Cameras, Nonuniformity corrections, Thermography, Resistance, Infrared imaging

Proceedings Article | 30 August 2004 Paper
Daniel Murphy, Michael Ray, Jessica Wyles, James Asbrock, C. Hewitt, Richard Wyles, Eli Gordon, T. Sessler, Adam Kennedy, Stefan Baur, David Van Lue, Steven Anderson, Richard Chin, H. Gonzales, C. Le Pere, S. Ton, Thomas Kostrzewa
Proceedings Volume 5406, (2004) https://doi.org/10.1117/12.548883
KEYWORDS: Microbolometers, Staring arrays, Sensors, Readout integrated circuits, Imaging systems, Electronics, Infrared imaging, Thermography, Resistance, Semiconducting wafers

Proceedings Article | 10 October 2003 Paper
John Anderson, Daryl Bradley, Chungte Chen, Richard Chin, H. Gonzalez, Ronald Hegg, K. Kostrzewa, C. Le Pere, S. Ton, Adam Kennedy, Daniel Murphy, Michael Ray, Richard Wyles, James Miller, Gwendolyn Newsome
Proceedings Volume 5074, (2003) https://doi.org/10.1117/12.487646
KEYWORDS: Sensors, Staring arrays, Thermography, Infrared sensors, Cameras, Infrared imaging, Microbolometers, Readout integrated circuits, Surveillance, Unmanned aerial vehicles

Proceedings Article | 10 October 2003 Paper
Daniel Murphy, Adam Kennedy, Michael Ray, Richard Wyles, Jessica Wyles, James Asbrock, C. Hewitt, David Van Lue, T. Sessler, John Anderson, Daryl Bradley, Richard Chin, H. Gonzales, C. Le Pere, Thomas Kostrzewa
Proceedings Volume 5074, (2003) https://doi.org/10.1117/12.487657
KEYWORDS: Microbolometers, Sensors, Staring arrays, Readout integrated circuits, Resistance, Thermography, Imaging systems, Electronics, Cameras, Unmanned aerial vehicles

Proceedings Article | 23 January 2003 Paper
Daniel Murphy, Michael Ray, Richard Wyles, James Asbrock, Nancy Lum, Jessica Wyles, C. Hewitt, Adam Kennedy, David Van Lue, John Anderson, Daryl Bradley, Richard Chin, Thomas Kostrzewa
Proceedings Volume 4820, (2003) https://doi.org/10.1117/12.453902
KEYWORDS: Staring arrays, Microbolometers, Sensors, Resistance, Thermography, Semiconducting wafers, Micromachining, Image quality, Image resolution, Analog electronics

Showing 5 of 13 publications
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