Dr. Kenneth Hanson
SPIE Involvement:
Author | Instructor
Area of Expertise:
Bayesian analysis , CT reconstruction , Uncertianty estimation , statistical techniques , Detectability in images
Websites:
Profile Summary

Kenneth M. Hanson retired in 2004 from the Los Alamos National Laboratory, where he was a Senior Scientist (staff member). He received his Bach. Engineering Physics degree from Cornell University in 1963 and his MS and PhD in physics from Harvard University in 1967 and 1970, respectively. He has published more than 160 journal and proceedings papers, several book chapters and has edited numerous proceedings. His research areas included high-energy electron and photon experiments, proton CT, image quality assessment, image task performance, CT reconstruction from limited data, Bayesian analysis, characterization of posterior probability distributions and validation of simulation codes. In regard to SPIE MI, Hanson served on the organizing committee for the Image Processing Conference (IP) for many years, was IP (co)chair from 1996 to 2001 and Symposium co-chair from 2002 to 2004. He also taught a short course on technical writing from 2006 to 2018 and was the “official photographer” for the Symposium from 2008 to 2018. In 2017 Hanson received two awards from SPIE: the Recognition of Outstanding Achievement Award and the prestigious SPIE Director's Award. He is a Fellow of SPIE, Senior Member of the American Physical Society and Senior Member of IEEE.
Publications (31)

SPIE Journal Paper | 11 April 2022 Open Access
JMI, Vol. 9, Issue S1, 012204, (April 2022) https://doi.org/10.1117/12.10.1117/1.JMI.9.S1.012204

Proceedings Article | 22 March 2016 Paper
Proceedings Volume 9783, 97830C (2016) https://doi.org/10.1117/12.2216531
KEYWORDS: Ultrasonography, Ultrasound tomography, Breast, Transducers, Breast cancer, Data acquisition, Tomography, Algorithm development, Signal attenuation, Design for manufacturability, Prototyping, Mammography, In vivo imaging

Proceedings Article | 17 March 2015 Paper
Lianjie Huang, Junseob Shin, Ting Chen, Youzuo Lin, Miranda Intrator, Kenneth Hanson, Katherine Epstein, Daniel Sandoval, Michael Williamson
Proceedings Volume 9419, 941916 (2015) https://doi.org/10.1117/12.2082404
KEYWORDS: Ultrasonography, Transducers, Breast, Ultrasound tomography, Imaging systems, Data acquisition, Tomography, Prototyping, Mammography, Breast cancer

Proceedings Article | 20 March 2014 Paper
Lianjie Huang, Youzuo Lin, Zhigang Zhang, Yassin Labyed, Sirui Tan, Nghia Nguyen, Kenneth Hanson, Daniel Sandoval, Michael Williamson
Proceedings Volume 9040, 90400T (2014) https://doi.org/10.1117/12.2043136
KEYWORDS: Ultrasonography, Transducers, Breast, Tomography, Data acquisition, Reflection, Ultrasound tomography, Virtual point source, Cancer, Tumors

Proceedings Article | 29 March 2013 Paper
Lianjie Huang, Yassin Labyed, Kenneth Hanson, Daniel Sandoval, Jennifer Pohl, Michael Williamson
Proceedings Volume 8675, 86751O (2013) https://doi.org/10.1117/12.2007653
KEYWORDS: Ultrasonography, Breast, Mammography, Imaging systems, Super resolution, Data acquisition, Transducers, Optical spheres, Image resolution, Glasses

Showing 5 of 31 publications
Proceedings Volume Editor (6)

SPIE Conference Volume | 3 July 2001

SPIE Conference Volume | 6 June 2000

SPIE Conference Volume | 21 May 1999

SPIE Conference Volume | 24 June 1998

SPIE Conference Volume | 25 April 1997

Showing 5 of 6 publications
Conference Committee Involvement (9)
Medical Imaging 2004
14 February 2004 | San Diego, United States
Medical Imaging 2003
15 February 2003 | San Diego, United States
Medical Imaging 2002
23 February 2002 | San Diego, United States
Medical Imaging 2001: Image Processing
19 February 2001 | San Diego, CA, United States
Image Processing
14 February 2000 | San Diego, CA, United States
Showing 5 of 9 Conference Committees
Course Instructor
WS776: Writing for Publication
This course teaches attendees the skills needed to create well-written scientific articles for publication in journals or proceedings. We discuss the structure of a paper and the roles of its various parts. You will learn the principles of good technical writing and how to avoid common pitfalls. We will discuss how to use writer's aids, many of which are available on line.
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