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Lukasz Drewniak
at Silesian Univ of Technology
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Publications (1)
Proceedings Article | 25 July 2013 Paper
The analysis of filling pulse parameters influence on ICTS data of GaAs MIS structures
Ł. Drewniak, S. Kochowski, K. Nitsch, R. Paszkiewicz, B. Paszkiewicz
Proceedings Volume 8902, 890209 (2013) https://doi.org/10.1117/12.2030108
KEYWORDS: Printed circuit board testing, Interfaces, Gallium arsenide, Semiconductors, Capacitance, Spectroscopy, Silicon, Analytical research, Convolution, Microsystems
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