Dr. Mark G. da Silva
Manager of Design Ctr. at Exponent Inc
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 19 January 2007 Paper
Mark da Silva, Siebe Bouwstra
Proceedings Volume 6463, 64630C (2007) https://doi.org/10.1117/12.714852
KEYWORDS: Microelectromechanical systems, Standards development, Metrology, Semiconducting wafers, Reliability, Thin films, Tolerancing, Resonators, Process control, Semiconductors

Proceedings Article | 16 August 2004 Paper
Gerold Schropfer, Mark McNie, Mark da Silva, Rhodri Davies, Alexandra Rickard, Francois-Xavier Musalem
Proceedings Volume 5455, (2004) https://doi.org/10.1117/12.544971
KEYWORDS: Computer aided design, Microelectromechanical systems, Manufacturing, Design for manufacturing, Resonators, Design for manufacturability, Monte Carlo methods, Materials processing, Tolerancing, Semiconducting wafers

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