Masashi Kanaoka
at Dainippon Screen Manufacturing Co Ltd
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 1 April 2009 Paper
Keisuke Ehara, Tatsuhiko Ema, Toshinari Yamasaki, Seiji Nakagawa, Seiji Ishitani, Akihiko Morita, Jeonghun Kim, Masashi Kanaoka, Shuichi Yasuda, Masaya Asai
Proceedings Volume 7273, 727322 (2009) https://doi.org/10.1117/12.814234
KEYWORDS: Semiconducting wafers, Critical dimension metrology, Particles, Etching, Scanners, Scanning electron microscopy, Temperature metrology, Lithography, Silicon, Inspection

Proceedings Article | 1 April 2008 Paper
Alberto Beccalli, Paolo Canestrari, Mark Goeke, Masashi Kanaoka, Helmut Kandraschow, Takuya Kuroda, Danilo De Simone, Paolo Piacentini, Miriam Padovani, Paolo Piazza, Alessandro Rossi
Proceedings Volume 6924, 69244X (2008) https://doi.org/10.1117/12.779150
KEYWORDS: Semiconducting wafers, Critical dimension metrology, Immersion lithography, Lithography, Scanners, Silicon, Photoresist materials, Coating, Prototyping, Liquids

Proceedings Article | 24 March 2008 Paper
Proceedings Volume 6922, 69222X (2008) https://doi.org/10.1117/12.772411
KEYWORDS: Semiconducting wafers, Particles, Lithography, Coating, Diffractive optical elements, Immersion lithography, Thin film coatings, Inspection, Silicon, Scanning electron microscopy

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