At SPring-8 BL28B2, Hoshino et al. developed a CT measurement technique using high-energy x-rays (200keV) to observe internal structures of materials. Combining this with a sample exchange robot, high-def x-ray camera, and SP8-DC computer tech, they automated the process from measurement to image reconstruction. The system captures projection images with a maximum field of view of 48mm x 1.2mm, handling larger specimens by repeated scans and stacking CT images. Measuring a sample with the size of 48mm x 10mm takes about 1.5 hours with the effective pixel size of 3.72um/pixel. Then, transferring the data to SP8-DC is completed within half an hour, and image reconstruction takes approximately 6 hours.
Athena, a future high-energy mission, is expected to consist of a large aperture x-ray mirror with a focal length of 12 m. The mirror surface is to be coated with iridium and a low Z overcoat. To define the effective area of the x-ray telescope, the atomic scattering factors of iridium with an energy resolution less than that (2.5 eV) of the x-ray integral field unit are needed. We measured the reflectance of the silicon pore optics mirror plate coated with iridium in the energy range of 9 to 15 keV and that near the iridium L-edges in steps of 10 and 1.5 eV, respectively, at the synchrotron beamline SPring-8. The L3, L2, and L1 edges were clearly detected around 11,215, 12,824, and 13,428 eV, respectively. The measured scattering factors were ∼3 % smaller than the corresponding values reported by Henke et al., likely due to the presence of an overlayer on the iridium coating, and were consistent with those measured by Graessle et al. The angular dependence of the reflectivity measured indicates that the iridium surface was extremely smooth, with a surface roughness of 0.3 nm.
X-ray phase tomography by Talbot interferometry functions with X-rays of a broad energy band, and a pink- beam extracted by a multilayer mirror from white synchrotron radiation is used for four-dimensional X-ray phase tomography, which was developed at BL28B2, SPring-8, Japan. Polymer samples under infrared laser irradiation were observed as model experiments of laser processing. In this paper, laser ablation for a carbon-fiber reinforced polymer (CFRP) sample is reported. Thanks to the fact that the fibrous structure generates visibility (or dark-field) contrast, four-dimensional tomogram from the visibility reduction is presented. A technical effort to improve the temporal resolution from 1 s to 160 ms is also described.
This paper review the configurations of grating-based X-ray interferometry for X-ray phase imaging/tomography and describes recent activities for four-dimensional X-ray phase tomography and nanoscopic X-ray phase tomog-
raphy. A multilayer mirror to produce a 10% bandwidth pink beam at 25 keV has been installed at SPring-8 for four-dimensional X-ray phase tomography, and an application to polymer laser ablation is presented. A 100-fold full-field X-ray microscope employing a Fresnel zone plate has been used successfully in combination with a Talbot interferometer to perform nanoscopic phase tomography for a malleal processus brevis of a mouse nine days after birth. Another development using a laboratory-based full-field X-ray microscope in combination with a Lau interferometer is also described.
A high energy X-ray micro-tomography system has been developed at BL20B2 in SPring-8. The available range of the
energy is between 20keV and 113keV with a Si (511) double crystal monochromator. The system enables us to image
large or heavy materials such as fossils and metals. The X-ray image detector consists of visible light conversion system
and sCMOS camera. The effective pixel size is variable by changing a tandem lens between 6.5 μm/pixel and 25.5
μm/pixel discretely. The format of the camera is 2048 pixels x 2048 pixels. As a demonstration of the system, alkaline
battery and a nodule from Bolivia were imaged. A detail of the structure of the battery and a female mold Trilobite were
successfully imaged without breaking those fossils.
We have launched a project to promote grating-based X-ray phase imaging/tomography extensively. Here, two main activities are presented for enabling dynamic, or four-dimensional, X-ray phase tomography and nanoscopic X-ray phase tomography by grating interferometry. For the former, while some demonstrations in this direction were performed with white synchrotron radiation, improvement in image quality by spectrum tuning is described. A preliminary result by a total reflection mirror is presented, and as a next step, preparation of a 10% bandpass filter by a multilayer mirror is reported. For the latter, X-ray microscopes available both at synchrotron radiation facilities and laboratories equipped with a Fresnel zone plate are combined with grating interferometry. Here, a preliminary result with a combination of a Lau interferometer and a laboratory-based X-ray microscope is presented.
A new micro-tomography system for materials science has been developed at BL20B2 in SPring-8. The system enables us
to do stretching, press and twist of materials with a translation stage and two precise rotation stages arranged opposite to
each other. Each deformation can be operated with constant moving rate. The maximum load is about 2 kN because of the
hardness of the precision stages. The X-ray image detector consists of visible light conversion system and sCMOS camera.
The effective pixel size is variable by changing a tandem lens between 2.7 μm/pixel to 13.2 μm /pixel discretely. As a
demonstration of the system, a viscoelastic object was imaged. The experimental conditions are follows, X-ray energy: 25
keV, exposure time: 5 msec, number of projections: 900, single scan time: 7.5 sec, pixel size: 13.2 μm /pixel and field of
view: 27.0 mm x 3.9 mm. The stretching rate was 1 μm /sec to 5 μm /sec. A metastable state such as tensile loading of
viscoelastic materials is possible with this system.
A fast micro-tomography system and a high throughput micro-tomography system using state-of-the-art Complementary Metal Oxide Semiconductor (CMOS) imaging devices have been developed at SPring-8. Those systems adopt simple projection type tomography using synchrotron radiation X-ray. The fast micro-tomography system achieves a scan time around 2 s with 1000 projections, which is 15 times faster than previously developed system at SPring-8. The CMOS camera for fast tomography has 64 Giga Byte on-board memory, therefore, the obtained images must be transferred to a PC at the appropriate timing. A melting process of snow at room temperature was imaged every 30 s as a demonstration of the system. The high throughput tomography system adopts a scientific CMOS (sCMOS) camera with a low noise and high quantum efficiency. The system achieves a scan time around 5 minutes which is three times faster than before. The images quality of the system has been compared to the existing system with Charge-Coupled Device (CCD) camera. The results have shown the advantage of the new sCMOS camera.
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