Prof. Masatsugu Shimomura
Principal Investigator at Tohoku Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 4 April 2012 Paper
Proceedings Volume 8339, 83390E (2012) https://doi.org/10.1117/12.915043
KEYWORDS: Reflection, Osmium, Refractive index, Composites, Ultraviolet radiation, Interfaces, Absorption, Sputter deposition, Scanning electron microscopy, Thin films

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