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Dr. Max Christian Lemme
Professor at AMO GmbH
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Publications (3)
Proceedings Article | 20 June 2024 Presentation + Paper
Design of a miniaturized MID-IR spectroscopy solution, based on a 400 nm SiPh platform, for the detection of CO2 and CH4
Georgios Syriopoulos, Charalampos Zervos, Giannis Poulopoulos, Evrydiki Kyriazi, Thenia Prousalidi, Pen-Sheng Lin, Frank Niklaus, Kristinn Gylfason, Nour Negm, Stephan Suckow, Max Lemme, Dimitris Apostolopoulos, Hercules Avramopoulos
Proceedings Volume 12999, 129990N (2024) https://doi.org/10.1117/12.3022431
KEYWORDS: Waveguides, Reflectors, Silicon, Design, Bragg wavelengths, Bragg gratings, Mid infrared, Spectroscopy, Refractive index
Proceedings Article | 5 March 2022 Presentation + Paper
Wafer-scale integration of layered 2D materials by adhesive wafer bonding
Proceedings Volume 12003, 1200304 (2022) https://doi.org/10.1117/12.2605116
KEYWORDS: Graphene, Semiconducting wafers, Adhesives, Molybdenum, Heterojunctions, Wafer bonding, Chemical vapor deposition, Silicon, Raman spectroscopy, Resistance, Optoelectronics integration, Very large scale integration
Proceedings Article | 28 September 2017 Paper
Challenges for scanning electron microscopy and inspection on the nanometer scale for non-IC application: and how to tackle them using computational techniques
Jens Bolten, Kerim Arat, Nezih Ünal, Caroline Porschatis, Thorsten Wahlbrink, Max Lemme
Proceedings Volume 10446, 104460G (2017) https://doi.org/10.1117/12.2279564
KEYWORDS: Scanning electron microscopy, Inspection, Image analysis, Image processing, Metrology, Nanofabrication, Nanostructures, Basic research, Analytical research
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