Maximilien J. Collon
Managing Director at cosine measurement systems
SPIE Involvement:
Author
Publications (154)

Proceedings Article | 22 August 2024 Presentation
Desiree Della Monica Ferreira, Sara Svendsen, Sonny Massahi, Nis Gellert, Diego Sanz, Arne Jegers, Boris Landgraf, Max Collon, Ivo Ferreira, Marcos Bavdaz, Finn Christensen
Proceedings Volume 13093, 130931A (2024) https://doi.org/10.1117/12.3020048

Proceedings Article | 21 August 2024 Poster + Paper
S. Massahi, S. Svendsen, D. Paredes-Sanz, D. D. Ferreira, F. Christensen, N. Gellert, A. 'S Jegers, M. Collon, D. Girou, B. Landgraf, A. Thete, I. Ferreira, M. Bavdaz, L. Cibik, D. Skroblin, C. Gollwitzer, M. Krumrey
Proceedings Volume 13093, 1309356 (2024) https://doi.org/10.1117/12.3020396
KEYWORDS: Chromium, Film thickness, Coating stress, Thin films, Thin film coatings, Design, Data modeling, Surface roughness, Reflectivity, Data acquisition

Proceedings Article | 21 August 2024 Poster + Paper
Proceedings Volume 13093, 130934S (2024) https://doi.org/10.1117/12.3020164
KEYWORDS: Crystals, X-rays, Calibration, Collimation, Parabolic mirrors, Laser crystals, X-ray optics, Point spread functions, X-ray sources, Quartz

Proceedings Article | 21 August 2024 Paper
Proceedings Volume 13093, 130934X (2024) https://doi.org/10.1117/12.3017800
KEYWORDS: X-rays, Sensors, Mirrors, Detector arrays, Synchrotrons, Silicon, X-ray optics, Laser soldering, Reflection, Optical alignment

Proceedings Article | 21 August 2024 Poster + Paper
Jeroen Haneveld, Bart Schurink, Marko Blom, Mathijs Bosman, Bastiaan van Dam, Arenda Koelewijn, Jan-Joost Lankwarden, Mark Olde Riekerink, Ronald Start, Maurice Wijnperle, Maximilien Collon, Ramses Günther, Laurens Keek, Boris Landgraf, Adam Lassise, Paulo da Silva Ribeiro, Aniket Thete, Giuseppe Vacanti, Marcos Bavdaz, Ivo Ferreira, Eric Wille
Proceedings Volume 13093, 130934P (2024) https://doi.org/10.1117/12.3017561
KEYWORDS: Mirrors, Semiconducting wafers, Silicon, Coating, Manufacturing, Ion beam finishing, Lithography, Optics manufacturing, X-ray optics, Wafer dicing, Space mirrors, Wafer bonding, Wet etching

Showing 5 of 154 publications
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