We report on time-of-flight (TOF) hole mobility measurements in an aged discotic columnar liquid crystal, Hexakis(pentyloxy)triphenylene (HAT5). The experimental data was fit to an interfacial trapping model based on Van de Walle’s approximations. The theory accurately reproduces the TOF transients of delayed charge release near the optically excited material/electrode interface. Interfacial trapping appears only in the aged materials, but the bulk mobility is the same as that of the pristine material. We also discuss preliminary results of TOF photocurrent transients of HAT5 exposed to ozone.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.