Prof. Minkyung Kim
at Gwangju Institute of Science and Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 4 October 2023 Presentation
Proceedings Volume PC12646, PC126460F (2023) https://doi.org/10.1117/12.2672557
KEYWORDS: Dielectrics, Refractive index, Phase measurement, Optical components, Miniaturization, Incident light, Engineering, Chemical vapor deposition, Amorphous silicon

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