Mohamed Bahr
at Siemens EDA
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 16 March 2016 Paper
Proceedings Volume 9781, 978114 (2016) https://doi.org/10.1117/12.2220276
KEYWORDS: Metals, Design for manufacturing, Manufacturing, Critical dimension metrology, Shape analysis, Etching, Databases, Visualization, Design for manufacturability, Logic devices

Proceedings Article | 18 March 2015 Paper
Proceedings Volume 9427, 942715 (2015) https://doi.org/10.1117/12.2185545
KEYWORDS: Metals, Design for manufacturing, Manufacturing, Critical dimension metrology, Shape analysis, Etching, Databases, Visualization, Design for manufacturability, Optical proximity correction

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